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AT-31033-TR1 Datasheet(PDF) 2 Page - Agilent(Hewlett-Packard) |
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AT-31033-TR1 Datasheet(HTML) 2 Page - Agilent(Hewlett-Packard) |
2 / 10 page 4-34 AT-31011, AT-31033 Absolute Maximum Ratings Symbol Parameter Units Absolute Maximum[1] VEBO Emitter-Base Voltage V 1.5 VCBO Collector-Base Voltage V 11 VCEO Collector-Emitter Voltage V 5.5 IC Collector Current mA 16 PT Power Dissipation[2,3] mW 150 Tj Junction Temperature °C 150 TSTG Storage Temperature °C -65 to 150 Notes: 1. Operation of this device above any one of these parameters may cause permanent damage. 2. TMounting Surface = 25°C. 3. Derate at 1.82 mW/ °C for T C > 67.5°C. Figure 1. Test Circuit for Noise Figure and Associated Gain. This Circuit is a Compromise Match Between Best Noise Figure, Best Gain, Stability, a Practical, Synthesizable Match, and a Circuit Capable of Matching Both the AT-305 and AT-310 Geometries. Electrical Specifications, TA = 25°C AT-31011 AT-31033 Symbol Parameters and Test Conditions Units Min Typ Max Min Typ Max NF Noise Figure VCE = 2.7 V, IC = 1 mA f = 0.9 GHz dB 0.9 [1] 1.2 [1] 0.9 [2] 1.2 [2] GA Associated Gain VCE = 2.7 V, IC = 1 mA f = 0.9 GHz dB 11 [1] 13 [1] 9 [2] 11 [2] hFE Forward Current VCE = 2.7 V - 70 300 70 300 Transfer Ratio IC = 1 mA ICBO Collector Cutoff Current VCB = 3 V µA 0.05 0.2 0.05 0.2 IEBO Emitter Cutoff Current VEB = 1 V µA 0.1 1.5 0.1 1.5 Notes: 1. Test circuit B, Figure 1. Numbers reflect device performance de-embedded from circuit losses. Input loss = 0.4 dB; output loss = 0.4 dB. 2. Test circuit A, Figure 1. Numbers reflect device performance de-embedded from circuit losses. Input loss = 0.4 dB; output loss = 0.4 dB. 1000 pF VBB W = 10 L = 1860 W = 10 L = 1000 W = 30 L = 100 W = 30 L = 100 W = 10 L = 1860 1000 pF VCC 25 Ω W = 10 L = 1025 TEST CIRCUIT A: W = 20 L = 100 TEST CIRCUIT B: W = 20 L = 200 x 2 NOT TO SCALE TEST CIRCUIT BOARD MATL = 0.062" FR-4 ( ε = 4.8) DIMENSIONS IN MILS Thermal Resistance[2]: θ jc = 550°C/W |
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