LIMITS

PARAMETER

CONDITIONS

UNIT

SYMBOL

Differential Input Voltage:

ONE

V

Pins 4 to 5,6 to 7: Common

6.5

10.0

13.0

V

ZERO

V

mode voltage less than ±4V

-13.0

-10.0

-6.5

V

NULL

V

with respect to GND

-2.5

0

2.5

V

Input Resistance:

Differential

R

12

K

To GND

R

12

27

K

To Vcc

R

12

27

K

Input Current:

Input Sink

I

200

µA

Input Source

I

-450

µA

Input Capacitance:

Differential

C

Pins4 to 5,6 to 7

20

pF

(Guaranteed but not tested)

To GND

C

20

pF

To Vcc

C

20

pF

Input Voltage:

Input Voltage HI

V

2.1

V

Input Voltage LO

V

0.7

V

Input Current:

Input Sink

I

1.5

µA

Input Source

I

-1.5

µA

Input Voltage:

Input Voltage HI

V

3.5

V

Input Voltage LO

V

0.7

V

Input Current:

Input Sink

I

10

µA

Input Source

I

-20

Input Voltage

Input Voltage HI

2.1

-

V+

V

-

-

0.5

V

Input Current

Input Sink

= 0V

0.1

MIN

TYP

MAX

ARINC INPUTS-

Pins 4, 5,6& 7

BI-DIRECTIONAL INPUTS- Pins 13- 22, 24- 29

OTHER INPUTS- Pins 1, 8 - 12, 30, 31, 39, 40& 43

INPUT- SLP1.5, PIN 38

IH

IL

NUL

I

G

H

IH

IL

I

G

H

IH

IL

IH

IL

IH

IL

IH

IL

V

Input Voltage LO

V

I

V

µA

Input Source

I

V

= 5V

0.1

µA

IH

IL

IH

IN

IL

IN

Vcc= 5V ±5%,

GND= 0V, TA= Operating Temperature Range (unless otherwise specified).

V+= 12V to 15V, V-= -12V to -15V,

Power Dissipation at 25C

Plastic PLCC

1.5 W, derate 10mW/ C

Ceramic J-LEAD CERQUAD

1.0 W, derate 7mW/

DC Current Drain per pin

±10mA

Operating Temperature Range:

(Industrial)

-40°C to +85°C

(Military)

-55°C to +125°C

°

°C

Storage Temperature Range:

-65°C to +150°C

Supply Voltages Vcc

-0.3V to +7V

V+

20V

V-

-20V

Voltage at pins 4, 5,6 and 7

-29V to +29V

Voltage at pin 38

-0.3 to V+ +0.3V

Voltage at any other pin

-0.3V to Vcc +0.3V

NOTE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only.

Functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications is not implied.

Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

HI-8281

HOLT INTEGRATED CIRCUITS

9