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HT48R05A Datasheet(PDF) 3 Page - Holtek Semiconductor Inc |
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HT48R05A Datasheet(HTML) 3 Page - Holtek Semiconductor Inc |
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3 / 44 page  Pin Description Pin No. Pin Name I/O ROM Code Option Description 4~1, 18~15 PA0~PA7 I/O Pull-high* Wake-up Bidirectional 8-bit input/output port. Each bit can be configured as wake-up input by ROM code option. Software instructions determine the CMOS output or schmitt trigger input with a pull-high resistor (deter- mined by pull-high options). 7 6 5 PB0/BZ PB1/BZ PB2 I/O Pull-high* I/O or BZ/BZ Bidirectional 3-bit input/output port. Software in- structions determine the CMOS output or schmitt trigger input with a pull-high resistor (determined by pull-high options). The PB0 and PB1 are pin-shared with the BZ and BZ, respectively. Once the PB0 and PB1 are selected as buzzer driving outputs, the output signals come from an internal PFD generator (shared with timer/event counter). 8 VSS ¾¾ Negative power supply, ground 9 10 PC0/INT PC1/TMR I/O Pull-high* Bidirectional I/O lines. Software instructions deter- mine the CMOS output or SCHMITT trigger input with a pull-high resistor (determined by pull-high op- tions). The external interrupt and timer input are pin-shared with the PC0 and PC1, respectively. The external interrupt input is activated on a high to low transition. 11 RES I ¾ Schmitt trigger reset input. Active low 12 VDD ¾¾ Positive power supply 13 14 OSC1 OSC2 I O Crystal or RC OSC1, OSC2 are connected to an RC network or Crys- tal (determined by ROM code option) for the internal system clock. In the case of RC operation, OSC2 is the output terminal for 1/4 system clock. * All pull-high resistors are controlled by an option bit. Absolute Maximum Ratings Supply Voltage ...............VSS-0.3V to VSS+5.5V Storage Temperature.................-50°Cto125°C Input Voltage.................VSS-0.3V to VDD+0.3V Operating Temperature ..............-40°Cto85°C Note: These are stress ratings only. Stresses exceeding the range specified under "Absolute Maxi- mum Ratings" may cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed in the specification is not implied and prolonged expo- sure to extreme conditions may affect device reliability. HT48R05A-1 3 February 25, 2000 Preliminary |
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