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HM62W8511H Datasheet(PDF) 11 Page - Hitachi Semiconductor |
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HM62W8511H Datasheet(HTML) 11 Page - Hitachi Semiconductor |
11 / 13 page HM62W8511H Series 11 Low V CC Data Retention Characteristics (Ta = 0 to +70°C) This characteristics is guaranteed only for L-version. Parameter Symbol Min Typ* 1 Max Unit Test conditions V CC for data retention V DR 2.0 — — V V CC ≥ CS ≥ VCC – 0.2 V (1) 0 V ≤ Vin ≤ 0.2 V or (2) V CC ≥ Vin ≥ VCC – 0.2 V Data retention current I CCDR — 40 600 µAV CC = 3 V, VCC ≥ CS ≥ VCC – 0.2 V (1) 0 V ≤ Vin ≤ 0.2 V or (2) V CC ≥ Vin ≥ VCC – 0.2 V Chip deselect to data retention time t CDR 0 — — ns See retention waveform Operation recovery time t R 5 ——ms Note: 1. Typical values are at V CC = 3.0 V, Ta = +25˚C, and not guaranteed. Low V CC Data Retention Timing Waveform VCC 3.0 V 2.2 V 0 V CS tCDR tR VCC ≥ CS ≥ VCC – 0.2 V VDR Data retention mode |
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