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B32537B2684J000 Datasheet(PDF) 11 Page - TDK Electronics |
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B32537B2684J000 Datasheet(HTML) 11 Page - TDK Electronics |
11 / 24 page Technical data Operating temperature range Max. operating temperature Top,max +125 °C Upper category temperature Tmax +100 °C Lower category temperature Tmin 55 °C Rated temperature TR +85 °C Dissipation factor tan δ (in 10-3) C R ( µF) ≤ 0.47 0.47 < CR ≤4.7 4.7 < C R ≤10.0 > 10.0 at 20 °C at 1 kHz 7 8 8 10 (upper limit values) at 10 kHz 15 22 25 Insulation resistance Rins CR or time constant τ = C R Rins ≤ 0.33 µF > 15000 M Ω at 20 °C, rel. humidity ≤ 65% > 0.33 µF > 5000 s (minimum as-delivered values) DC test voltage 1.4 VR, 2 s Category voltage VC TA ( °C) DC voltage derating AC voltage derating (continuous operation with VDC TA ≤ 85 VC = VR VC,RMS = VRMS or VAC at f ≤ 60 Hz) 85<TA ≤100 V C = VR (165 TA)/80 VC,RMS=VRMS (165 TA)/80 Operating voltage Vop for TA ( °C) DC voltage (max. hours) AC voltage (max. hours) short operating periods TA ≤ 100 Vop = 1.25 VC (2000 h) Vop = 1.0 VC,RMS (2000 h) (VDC or VAC at f ≤ 60 Hz) 100<TA ≤125 V op = 0.5 VR (1000 h) Vop = 0.5 VRMS (1000 h) Damp heat test 56 days/40 °C/93% relative humidity Limit values after damp Capacitance change ∆C/C ≤ 5% heat test Dissipation factor change ∆ tan δ ≤ 5 10-3 (at 1 kHz) Insulation resistance Rins ≥ 50% of minimum as-delivered values Reliability: Failure rate λ 1 fit ( ≤ 1 10-9/h) at 0.5 V R, 40 °C Service life tSL 200 000 h at 1.0 VR, 85 °C For conversion to other operating conditions and temperatures, refer to chapter "Quality, 2 Reliability". Failure criteria: Total failure Short circuit or open circuit Failure due to variation Capacitance change ∆C/C > 10% of parameters Dissipation factor tan δ > 1.5 upper limit value Insulation resistance Rins < 150 M Ω (C R ≤ 0.33 µF) or time constant τ = C R Rins < 50 s (CR > 0.33 µF) B32537 High reliability (wound) Page 7 of 20 Please read Cautions and warnings and Important notes at the end of this document. |
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