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SSF8N80 Datasheet(PDF) 7 Page - Silikron Semiconductor Co.,LTD. |
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SSF8N80 Datasheet(HTML) 7 Page - Silikron Semiconductor Co.,LTD. |
7 / 8 page SSF8N80 ©Silikron Semiconductor CO.,LTD. 2012.04.28 Version : 1.1 page 7 of 8 www.silikron.com Ordering and Marking Information Device Marking: SSF8N80 Package (Available) TO220 Operating Temperature Range C : -55 to 150 ºC Devices per Unit Package Type Units/ Tube Tubes/Inner Box Units/Inner Box Inner Boxes/Carton Box Units/Carton Box TO220 50 20 1000 6 6000 Reliability Test Program Test Item Conditions Duration Sample Size High Temperature Reverse Bias(HTRB) Tj=125℃ to 150℃ @ 80% of Max VDSS/VCES/VR 168 hours 500 hours 1000 hours 3 lots x 77 devices High Temperature Gate Bias(HTGB) Tj=150℃ @ 100% of Max VGSS 168 hours 500 hours 1000 hours 3 lots x 77 devices |
Similar Part No. - SSF8N80 |
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Similar Description - SSF8N80 |
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