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LMH658 Datasheet(PDF) 5 Page - Texas Instruments |
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LMH658 Datasheet(HTML) 5 Page - Texas Instruments |
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5 / 32 page  LMH6584, LMH6585 www.ti.com SNOSB08B – APRIL 2008 – REVISED APRIL 2013 ±5V Electrical Characteristics (1) Unless otherwise specified, typical conditions are: TA = 25°C, AV = +2, VS = ±5V, RL = 100Ω. Boldface limits apply at the temperature extremes. Parameter Test Conditions Min(2) Typ(3) Max(2) Units Frequency Domain Performance SSBW LMH6584, VOUT = 0.25 VPP (4) 400 LMH6585, VOUT = 0.5 VPP (4) 400 LSBW LMH6584, VOUT = 1VPP, RL = 1 kΩ (4) 400 −3 dB Bandwidth MHz LMH6585, VOUT = 2 VPP, RL = 1 kΩ (4) 400 LMH6584, VOUT = 1VPP, RL = 150Ω (4) 400 LMH6585, VOUT = 2 VPP, RL = 150Ω (4) 400 GF 0.1 dB Gain Flatness VOUT = 2 VPP, RL = 150Ω 50 MHz DG Differential Gain RL = 150Ω, 3.58 MHz/ 4.43 MHz .04 % DP Differential Phase RL = 150Ω, 3.58 MHz/ 4.43 MHz .03 deg Time Domain Response tr LMH6584, 2V Step, 10% to 90% 1.75 ns Rise Time LMH6585, 2V Step, 10% to 90% 1.25 tf LMH6584, 2V Step, 10% to 90% 1.5 Fall Time ns LMH6585, 2V Step, 10% to 90% 1.1 OS Overshoot 2V Step 5 % SR LMH6584, 2 VPP, 40% to 60% (5) 1100 Slew Rate V/µs LMH6585, 2 VPP, 40% to 60% (5) 1700 ts Settling Time 2V Step, VOUT Within 0.5% 10 ns Distortion And Noise Response HD2 2nd Harmonic Distortion 2 VPP, 5 MHz −72 dBc HD3 3rd Harmonic Distortion 2 VPP, 5 MHz −68 dBc en Input Referred Voltage Noise >1 MHz 12 nV/ √Hz in Input Referred Noise Current >1 MHz 22 pA/ √Hz Switching Time 50 ns XTLK Channel to Channel, f = 100 MHz −43 dBc Crosstalk Channel to Channel, f = 10 MHz −52 dBc ISOL Off Isolation f = 100 MHz −60 dBc Static, DC Performance AVOL LMH6584 0.987 1.00 1.013 Voltage Gain V/V LMH6585 1.98 2.00 2.02 VOS Input Offset Voltage Input Referred ±2 ±18 mV TCVOS Input Offset Voltage Temperature Drift See(6) 21 µV/°C IB Input Bias Current Non-Inverting(7) −7 −12 µA TCIB Input Bias Current Average Drift Non-Inverting(6) 3.8 nA/°C (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. No specification of parametric performance is indicated in the electrical tables under conditions different than those tested. (2) Room Temperature limits are 100% production tested at 25°C. Device self heating results in TJ ≥ TA, however, test time is insufficient for TJto reach steady state conditions. Limits over the operating temperature range are ensured through correlation using Statistical Quality Control (SQC) methods. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (4) The channel bandwidth varies over the different channel combinations and with expansion. See the application section for more details. (5) Slew Rate is the average of the rising and falling edges. (6) Drift determined by dividing the change in parameter at temperature extremes by the total temperature change. (7) Negative input current implies current flowing out of the device. Copyright © 2008–2013, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: LMH6584 LMH6585 |
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