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MSP430G2X33 Datasheet(PDF) 6 Page - Texas Instruments |
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MSP430G2X33 Datasheet(HTML) 6 Page - Texas Instruments |
6 / 71 page MSP430G2x33 MSP430G2x03 SLAS734F – APRIL 2011 – REVISED MAY 2013 www.ti.com Table 2. Terminal Functions TERMINAL NO. I/O DESCRIPTION NAME PW20, PW28 RHB32 N20 P1.0/ General-purpose digital I/O pin TA0CLK/ Timer0_A, clock signal TACLK input 2 2 31 I/O ACLK/ ACLK signal output A0 ADC10 analog input A0(1) P1.1/ General-purpose digital I/O pin TA0.0/ Timer0_A, capture: CCI0A input, compare: Out0 output / BSL transmit UCA0RXD/ 3 3 1 I/O USCI_A0 receive data input in UART mode UCA0SOMI/ USCI_A0 slave data out/master in SPI mode A1 ADC10 analog input A1(1) P1.2/ General-purpose digital I/O pin TA0.1/ Timer0_A, capture: CCI1A input, compare: Out1 output UCA0TXD/ 4 4 2 I/O USCI_A0 transmit data output in UART mode UCA0SIMO/ USCI_A0 slave data in/master out in SPI mode A2 ADC10 analog input A2(1) P1.3/ General-purpose digital I/O pin ADC10CLK/ ADC10, conversion clock output(1) 5 5 3 I/O A3/ ADC10 analog input A3(1) VREF-/VEREF- ADC10 negative reference voltage (1) P1.4/ General-purpose digital I/O pin SMCLK/ SMCLK signal output UCB0STE/ USCI_B0 slave transmit enable UCA0CLK/ 6 6 4 I/O USCI_A0 clock input/output A4/ ADC10 analog input A4(1) VREF+/VEREF+ ADC10 positive reference voltage(1) TCK JTAG test clock, input terminal for device programming and test P1.5/ General-purpose digital I/O pin TA0.0/ Timer0_A, compare: Out0 output / BSL receive UCB0CLK/ USCI_B0 clock input/output 7 7 5 I/O UCA0STE/ USCI_A0 slave transmit enable A5/ ADC10 analog input A5(1) TMS JTAG test mode select, input terminal for device programming and test P1.6/ General-purpose digital I/O pin TA0.1/ Timer0_A, compare: Out1 output A6/ ADC10 analog input A6(1) 14 22 21 I/O UCB0SOMI/ USCI_B0 slave out/master in SPI mode, UCB0SCL/ USCI_B0 SCL I2C clock in I2C mode TDI/TCLK JTAG test data input or test clock input during programming and test P1.7/ General-purpose digital I/O pin A7/ ADC10 analog input A7(1) UCB0SIMO/ USCI_B0 slave in/master out in SPI mode 15 23 22 I/O UCB0SDA/ USCI_B0 SDA I2C data in I2C mode TDO/TDI JTAG test data output terminal or test data input during programming and test(2) (1) MSP430G2x33 devices only (2) TDO or TDI is selected via JTAG instruction. 6 Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated |
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