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WR08 Datasheet(PDF) 7 Page - List of Unclassifed Manufacturers |
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WR08 Datasheet(HTML) 7 Page - List of Unclassifed Manufacturers |
7 / 9 page Approval sheet Page 7 of 9 ASC_WR_V21 Mar.- 2012 TEST AND REQUIREMENTS Essentially all tests are carried out according to the schedule of IEC publication 115-8, category LCT/UCT/56(rated temperature range : Lower Category Temperature, Upper Category Temperature; damp heat, long term, 56 days). The testing also meets the requirements specified by EIA, EIAJ and JIS. The tests are carried out in accordance with IEC publication 68, "Recommended basic climatic and mechanical robustness testing procedure for electronic components" and under standard atmospheric conditions according to IEC 60068-1, subclause 5.3. Unless otherwise specified, the following value supplied : Temperature: 15°C to 35°C. Relative humidity: 45% to 75%. Air pressure: 86kPa to 106 kPa (860 mbar to 1060 mbar). All soldering tests are performed with midly activated flux. REQUIREMENT TEST PROCEDURE / TEST METHOD Resistor 0 Ω Ω Ω Ω Electrical Characteristics JISC5201-1: 1998 Clause 4.8 - DC resistance values measurement - Temperature Coefficient of Resistance (T.C.R) Natural resistance change per change in degree centigrade. ( ) 6 1 2 1 1 2 10 × − − t t R R R (ppm/ °C) t1 : 20°C+5°C-1°C R1 : Resistance at reference temperature (20°C+5°C/-1 °C) R2 : Resistance at test temperature (-55°C or +155°C) Within the specified tolerance Refer to “QUICK REFERENCE DATA” <50m Ω Resistance to soldering heat(R.S.H) JISC5201-1:1998 Clause 4.18 Un-mounted chips completely immersed for 10±1second in a SAC solder bath at 260℃±5ºC ±5%:∆R/Rmax.±(1%+0.05Ω) ±1%:∆R/Rmax.±(0.5%+0.05Ω) no visible damage <50m Ω Solderability JISC5201-1: 1998 Clause 4.17 Un-mounted chips completely immersed for 2±0.5 second in a SAC solder bath at 235℃±5℃ 95% coverage min., good tinning and no visible damage Temperature cycling JISC5201-1: 1998 Clause 4.19 30 minutes at -55 °C±3°C, 2~3 minutes at 20°C+5°C-1°C, 30 minutes at +155 °C±3°C, 2~3 minutes at 20°C+5°C-1°C, total 5 continuous cycles ±5%: ∆R/R max. ±(1%+0.05Ω) ±1%:∆R/Rmax.±(0.5%+0.05Ω) No visible damage <50m Ω High Temperature Exposure MIL-STD-202 method 108 1000+48/-0 hours; without load in a temperature chamber controlled 155 ±3°C ±5%:∆R/Rmax.±(2%+0.1Ω) ±1%:∆R/Rmax.±(1%+0.1Ω) No visible damage <50m Ω Bending strength JISC5201-1: 1998 Clause 4.33 Resistors mounted on a 90mm glass epoxy resin PCB(FR4), bending once 3mm for 10sec, 5mm for WR04 ±5%:∆R/Rmax.±(1%+0.05Ω) ±1%:∆R/Rmax.±(1%+0.05Ω) No visual damaged <50m Ω Adhesion JISC5201-1: 1998 Clause 4.32 Pressurizing force: 5N, Test time: 10±1sec. No remarkable damage or removal of the terminations Short Time Overload (STOL) JISC5201-1: 1998 Clause 4.13 2.5 times RCWV or max. overload voltage, for 5seconds ±5%: ∆R/R max. ±(2%+0.05Ω) ±1%: ∆R/R max. ±(1%+0.05Ω) No visible damage <50m Ω |
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