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AH921NTR-G1 Datasheet(PDF) 8 Page - Diodes Incorporated |
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AH921NTR-G1 Datasheet(HTML) 8 Page - Diodes Incorporated |
8 / 14 page Data Sheet HIGH SENSITIVITY CMOS HALL-EFFECT LATCH AH921 Jul. 2011 Rev. 1. 2 BCD Semiconductor Manufacturing Limited 8 Test Circuit and Test Conditions (Continued) Figure 8. Test Condition of AH921 (Supply Current) Note 4: Output initial status is low when powering on. Note 5: The supply current ICC represents the average supply current. The output is open during measurement. Note 6: The device is put under the magnetic field: B<BRP. Figure 9. Test Condition of AH921 (Output Saturation Voltage) Note 7: The output saturation voltage VSAT is measured at VCC=3.5V and VCC=24V. Note 8: The device is put under the magnetic field: B>BOP. |
Similar Part No. - AH921NTR-G1 |
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