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NE434S01-T1B Datasheet(PDF) 1 Page - California Eastern Labs |
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NE434S01-T1B Datasheet(HTML) 1 Page - California Eastern Labs |
1 / 5 page DESCRIPTION The NE434S01 is a Hetero-Junction FET that uses the junction between Si-doped AlGaAs and undoped InGaAs to create very high mobility electrons. Its excellent low noise and high asso- ciated gain make it suitable for TVRO and other commercial systems. PART NUMBER NE434S01 PACKAGE OUTLINE S01 SYMBOLS PARAMETERS AND CONDITIONS UNITS MIN TYP MAX IGSO Gate to Source Leak Current, VGS = -3.0 V µA 0.5 10 IDSS Saturated Drain Current, VDS = 2.0 V, VGS = 0 V mA 20 80 150 VGS(off) Gate to Source Cutoff Voltage, VDS = 2.0 V, ID = 100 µA, V -0.2 -0.9 -2.5 gm Transconductance, VDS = 2.0 V, ID = 14 mA mS 70 85 NF1 Noise Figure, VDS = 2.0 V, ID = 15 mA, f = 4 GHz dB 0.35 0.45 GA1 Associated Gain, VDS = 2.0 V, ID = 15 mA, f = 4 GHz dB 13.0 15.5 NE434S01 FEATURES • VERY LOW NOISE FIGURE: 0.35 dB TYP at 4 GHz • HIGH ASSOCIATED GAIN: 15.5 dB TYP at 4 GHz • GATE WIDTH: 280 µm • TAPE & REEL PACKAGING OPTION AVAILABLE • LOW COST PLASTIC PACKAGE ELECTRICAL CHARACTERISTICS (TA = 25°C) MAXIMUM AVAILABLE GAIN, FORWARD INSERTION GAIN vs. FREQUENCY Frequency, f (GHz) C BAND SUPER LOW NOISE HJ FET California Eastern Laboratories 24 20 16 12 8 4 12 4 6 8 10 14 20 30 VDS = 2 V ID = 10 mA MSG. MAG. |S21S|2 PRELIMINARY DATA SHEET Note: 1. Typical values of noise figures and associated gain are those obtained when 50% of the devices from a large number of lots were individually measured in a circuit with the input individually tuned to obtain the minimum value. Maximum values are criteria established on the production line as a "go-no-go" screening tuned for the "generic" type but not each specimen. SYMBOLS CHARACTERISTIC UNITS MIN TYP MAX VDS Drain to Source Voltage V 2 2.5 ID Drain Current mA 15 20 PIN Input Power dBM 0 RECOMMENDED OPERATING CONDITIONS (TA = 25°C) |
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