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SAP5SD-B-G1-T Datasheet(PDF) 10 Page - List of Unclassifed Manufacturers |
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10 / 63 page SAP5S / SAP51 Universal Actuator-Sensor Interface IC Data Sheet July 17, 2012 © 2012 Zentrum Mikroelektronik Dresden AG — Rev. 3.1 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is PRELIMINARY and subject to changes without notice. 10 of 62 1.2. Operating Conditions Table 2: Operating Conditions Symbol Parameter Min Max. Unit Note VLTGN Negative supply voltage 0 0 V VLTGP DC voltage at LTGP relating to VLTGN 16 34 V 1, 2 ILTGP Operating current at VUIN = 30V 6 mA 3 ICL1 Max. output sink current at pins D3...D0, DSTBn 10 mA ICL2 Max. output sink current at pins P0...P3, PSTBnBn 10 mA amb Ambient temperature range, operating range -25 85 °C 1 Below V LTGPmin the power supply block may not be able to provide the specified output currents at UOUT and U5R. 2 Outside of these limits the send current shape and send current amplitude cannot be guaranteed. 3 f c = 16.000 MHz, no load at any pin, transmitter turned off, digital state machine is in idle state Table 3: Crystal Frequency Symbol Parameter Nom. Unit Note fc Crystal frequency 5.333/16.000 MHz 4 4 The IC automatically detects whether the crystal frequency is 5.333MHz or 16.000MHz and controls the internal clock circuit accordingly. 1.3. EMC Behavior The IC has to fulfill the requirements defined in AS-Interface Complete Specification V2.11 [1] and related test requirements AS-Interface Slave ICs. In addition to the AS-Interface Complete Specification and in combination with a reference component circuit the IC has to achieve a communication failure rate less than 10% of the allowed failure rate according to the "Fast Transient" test method specified in the related AS-Interface association test procedures. The above specified behavior is correct by design and has to be proven while IC characterization. 1.4. Quality Standards The quality of the IC will be ensured according to the ZMDI quality standards. ZMDI is a qualified supplier according to ISO/TS 16949:2002 and ISO 14001:1996. The following reference documents apply for the development process: Management Regulation: 0410 Product Development procedure Process Specification: ZMDI C7D 0.6µm Technology Functional device parameters are valid for device operating conditions specified in chapter 1.2 at page 8. Production device tests are performed within the recommended ranges of VLTGP - VLTGN, amb = +25°C (+85°C and -25°C on sample base only) unless otherwise stated. |
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