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ICS810251 Datasheet(PDF) 10 Page - Integrated Device Technology

Part # ICS810251
Description  VCXO and Synchronous Ethernet Jitter Attenuator
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

ICS810251 Datasheet(HTML) 10 Page - Integrated Device Technology

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ICS810251I Data Sheet
VCXO AND SYNCHRONOUS ETHERNET JITTER ATTENUATOR
ICS810251AGI REVISION B OCTOBER 5, 2012
10
©2012 Integrated Device Technology, Inc.
VCXO-PLL EXTERNAL COMPONENTS
Choosing the correct external components and having a proper
printed circuit board (PCB) layout is a key task for quality operation
of the VCXO-PLL. In choosing a crystal, special precaution must be
taken with the package and load capacitance (CL). In addition,
frequency, accuracy and temperature range must also be
considered. Since the pulling range of a crystal also varies with the
package, it is recommended that a metal-canned package like HC49
be used. Generally, a metal-canned package has a larger pulling
range than a surface mounted device (SMD). For crystal selection
information, refer to the VCXO Crystal Selection Application Note.
The crystal’s load capacitance CL characteristic determines its
resonating frequency and is closely related to the VCXO tuning
range. The total external capacitance seen by the crystal when
installed on a board is the sum of the stray board capacitance, IC
package lead capacitance, internal varactor capacitance and any
installed tuning capacitors (CTUNE).
If the crystal CL is greater than the total external capacitance, the
VCXO will oscillate at a higher frequency than the crystal
specification. If the crystal CL is lower than the total external
capacitance, the VCXO will oscillate at a lower frequency than the
crystal specification. In either case, the absolute tuning range is
reduced. The correct value of CL is dependant on the characteristics
of the VCXO. The recommended CL in the Crystal Parameter Table
balances the tuning range by centering the tuning curve.
The frequency of oscillation in the third overtone mode is not
necessarily at exactly three times the fundamental frequency. The
mechanical properties of the quartz element dictate the position of
the overtones relative to the fundamental. The oscillator circuit may
excite both the fundamental and overtone modes simultaneously.
This will cause a nonlinearity in the tuning curve. This potential
problem is why VCXO crystals are required to be tested for absence
of any activity inside a +/-200 ppm window at three times the
fundamental frequency. Refer to FL_3OVT and FL_3OVT_spurs in the
crystal Characteristics table.
The crystal and external loop filter
components should be kept as
close as possible to the device.
Loop filter and crystal traces
should be kept short and
separated from each other. Other
signal traces should be kept
separate and not run underneath
the device, loop filter or crystal
components.
VCXO Characteristics Table
VCXO-PLL Loop Bandwidth Selection Table
Crystal Characteristics
LF0
LF1
XTAL_IN
XTAL_OUT
RS
C
S
C
P
C
TUNE
C
TUNE
25MHz
Symbol
Parameter
Typical
Units
kVCXO
VCXO Gain
15000
Hz/V
CV_LOW
Low Varactor Capacitance
9.8
pF
CV_HIGH
High Varactor Capacitance
22.7
pF
Bandwidth
Crystal Frequency (MHz)
RS (k)CS (µF)
CP (µF)
246Hz (Low)
25
0.4
10
0.01
616Hz (Mid)
25
1.0
10
0.001
1000Hz (High)
25
1.65
10
0.001
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
Mode of Oscillation
Fundamental
fN
Frequency
25
MHz
fT
Frequency Tolerance
±20
ppm
fS
Frequency Stability
±20
ppm
Operating Temperature Range
-40
+85
0C
CL
Load Capacitance
10
pF
CO
Shunt Capacitance
4
pF
CO / C1
Pullability Ratio
220
240
ESR
Equivalent Series Resistance
20
Drive Level
1mW
Aging @ 25 0C
±3 per year
ppm


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