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THS4511RGTTG4 Datasheet(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # THS4511RGTTG4
Description  WIDEBAND, LOW-NOISE, LOW-DISTORTION, FULLY-DIFFERENTIAL AMPLIFIER
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

THS4511RGTTG4 Datasheet(HTML) 2 Page - National Semiconductor (TI)

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THS4511
SLOS471E – SEPTEMBER 2005 – REVISED NOVEMBER 2009
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
UNIT
VSS
Supply
VS– to VS+
5.5 V
voltage
VI
Input voltage
±VS
VID
Differential input voltage
4 V
IO
Output current
200 mA
Continuous power dissipation
See Dissipation Ratings Table
TJ
Maximum junction temperature(2)
+150°C
TJ
Maximum junction temperature, continuous operation, long term reliability(3)
+125°C
TA
Operating free-air temperature range
–40°C to +85°C
TSTG
Storage temperature range
–65°C to +150°C
HBM
2000 V
ESD ratings
CDM
1500 V
MM
100 V
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2)
The absolute maximum temperature under any condition is limited by the constraints of the silicon process.
(3)
The maximum junction temperature for continuous operation is limited by the package constraints. Operation above this temperature
may result in reduced reliability and/or lifetime of the device. The THS4511 incorporates a (QFN) exposed thermal pad on the underside
of the chip. This acts as a heatsink and must be connected to a thermally-dissipative plane for proper power dissipation. Failure to do so
may result in exceeding the maximum junction temperature which could permanently damage the device. See TI technical brief
SLMA002 and SLMA004 for more information about using the QFN thermally-enhanced package.
DISSIPATION RATINGS TABLE
POWER RATING
PACKAGE(1)
θJC
θJA
TA ≤ +25°C
TA = +85°C
RGT (16)
2.4°C/W
39.5°C/W
2.3 W
225 mW
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
2
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Copyright © 2005–2009, Texas Instruments Incorporated
Product Folder Link(s): THS4511


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