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OPA2835IRUNT Datasheet(PDF) 4 Page - National Semiconductor (TI) |
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OPA2835IRUNT Datasheet(HTML) 4 Page - National Semiconductor (TI) |
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4 / 53 page  OPA835 OPA2835 SLOS713E – JANUARY 2011 – REVISED JULY 2013 www.ti.com SPECIFICATIONS: VS+ = 2.7 V Test conditions unless otherwise noted: VS+ = +2.7 V, VS– = 0 V, VOUT = 1 VPP, RF = 0 Ω, RL = 2 kΩ, G = 1 V/V, Input and Output Referenced to mid-supply. TA = 25°C. Unless otherwise noted TEST PARAMETER CONDITIONS MIN TYP MAX UNITS LEVEL(1) DC PERFORMANCE Open-loop voltage gain (AOL) 100 120 dB A TA = 25°C ±100 ±500 A TA = 0°C to 70°C ±880 Input referred offset voltage µV TA = –40°C to 85°C ±1040 B TA = –40°C to 125°C ±1850 Input offset voltage drift(2) TA = 0°C to 70°C ±1.4 ±8.5 TA = –40°C to 85°C ±1.5 ±9 µV/°C B TA = –40°C to 125°C ±2.25 ±13.5 TA = 25°C 50 200 400 A TA = 0°C to 70°C 47 410 Input bias current nA TA = –40°C to 85°C 45 425 B TA = –40°C to 125°C 45 530 TA = 0°C to 70°C ±0.25 ±1.4 Input bias current drift(2) TA = –40°C to 85°C ±0.175 ±1.05 nA/°C B TA = –40°C to 125°C ±0.185 ±1.1 TA = 25°C ±13 ±100 A TA = 0°C to 70°C ±13 ±100 Input offset current nA TA = –40°C to 85°C ±13 ±100 B TA = –40°C to 125°C ±13 ±100 TA = 0°C to 70°C ±0.205 ±1.230 Input offset current drift(2) TA = –40°C to 85°C ±0.155 ±0.940 nA/°C B TA = –40°C to 125°C ±0.155 ±0.940 INPUT TA = 25°C, <3dB degradation in CMRR limit –0.2 0 V A Common-mode input range low TA = –40°C to 125°C, <3dB degradation in –0.2 0 V B CMRR limit TA = 25°C, <3dB degradation in CMRR limit 1.5 1.6 V A Common-mode input range high TA = –40°C to 125°C, <3dB degradation in 1.5 1.6 V B CMRR limit Common-mode rejection ratio 88 110 dB A Input impedance common mode 200||1.2 k Ω || pF C Input impedance differential mode 200||1 k Ω || pF C OUTPUT TA = 25°C, G = 5 0.15 0.2 V A Linear output voltage low TA = –40°C to 125°C, G = 5 0.15 0.2 V B TA = 25°C, G = 5 2.45 2.5 V A Linear output voltage high TA = –40°C to 125°C, G = 5 2.45 2.5 V B Output saturation voltage, High / Low TA = 25°C, G = 5 45/13 mV C TA = 25°C ±25 ±35 mA A Linear output current drive TA = –40°C to 125°C ±20 mA B (1) Test levels (all values set by characterization and simulation): (A) 100% tested at 25°C; over temperature limits by characterization and simulation. (B) Not tested in production; limits set by characterization and simulation. (C) Typical value only for information. (2) Input Offset Voltage Drift, Input Bias Current Drift, and Input Offset Current Drift are average values calculated by taking data at the end points, computing the difference, and dividing by the temperature range. 4 Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: OPA835 OPA2835 |
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