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GAL16V8D-15LD Datasheet(PDF) 2 Page - Lattice Semiconductor

Part # GAL16V8D-15LD
Description  High Performance E2CMOS PLD Generic Array Logic?
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Manufacturer  LATTICE [Lattice Semiconductor]
Direct Link  http://www.latticesemi.com
Logo LATTICE - Lattice Semiconductor

GAL16V8D-15LD Datasheet(HTML) 2 Page - Lattice Semiconductor

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Specifications GAL16V8D-7/10/883
2
VIL
Input Low Voltage
Vss – 0.5
0.8
V
VIH
Input High Voltage
2.0
Vcc+1
V
IIL1
Input or I/O Low Leakage Current
0V ≤ VIN ≤ VIL (MAX.)
100
μA
IIH
Input or I/O High Leakage Current
3.5V ≤ VIN ≤ VCC
——
10
μA
VOL
Output Low Voltage
IOL = MAX. Vin = VIL or VIH
0.5
V
VOH
Output High Voltage
IOH = MAX. Vin = VIL or VIH
2.4
V
IOL
Low Level Output Current
12
mA
IOH
High Level Output Current
–2
mA
IOS2
Output Short Circuit Current
VCC = 5V VOUT = 0.5V T
A= 25°C
–30
–150
mA
ICC
Operating Power
VIL = 0.5V VIH = 3.0V
L-7/-10
75
130
mA
Supply Current
ftoggle = 15MHz Outputs Open
1) The leakage current is due to the internal pull-up on all pins. See Input Buffer section for more information.
2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester
ground degradation. Characterized but not 100% tested.
3) Typical values are at Vcc = 5V and TA = 25 °C
Recommended Operating Conditions
Case Temperature (T
C) .............................. –55 to 125°C
Supply voltage (V
CC)
with Respect to Ground ..................... +4.50 to +5.50V
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL
PARAMETER
CONDITION
MIN.
TYP.3
MAX.
UNITS
Absolute Maximum Ratings(1)
Supply voltage V
CC ...................................... –0.5 to +7V
Input voltage applied .......................... –2.5 to V
CC +1.0V
Off-state output voltage applied ......... –2.5 to V
CC +1.0V
Storage Temperature ................................ –65 to 150°C
Case Temperature with
Power Applied ........................................ –55 to 125°C
1.Stresses above those listed under the “Absolute Maximum Rat-
ings” may cause permanent damage to the device. These are
stress only ratings and functional operation of the device at these
or at any other conditions above those indicated in the operational
sections of this specification is not implied (while programming,
follow the programming specifications).


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