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LTC3459EDC-PBF Datasheet(PDF) 3 Page - Linear Technology |
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LTC3459EDC-PBF Datasheet(HTML) 3 Page - Linear Technology |
3 / 12 page LTC3459 3 3459fc ELECTRICAL CHARACTERISTICS Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. Note 2: The LTC3459E is guaranteed to meet performance specifications from 0°C to 85°C. Specifications over the –40°C to 85°C operating temperature range are assured by design, characterization and correlation with statistical process controls. PARAMETER CONDITIONS MIN TYP MAX UNITS VIN Input Voltage Range l 1.5 5.5 V VIN Quiescent Current SHDN = VCC 10 20 μA VIN Shutdown Current SHDN = GND 0.1 1 μA VOUT Programmable Voltage Range l 2.5 10 V VOUT Quiescent Supply Current SHDN = VCC 24 μA VOUT Shutdown Current SHDN = GND 0.1 1 μA Reference Feedback Voltage VIN = 3.3V, VOUT = 7.5V l 1.19 1.22 1.25 V FB Input Leakage Current Measured on FB 10 50 nA Converter Performance Peak Switch Current (VIN = 3.3V) L = 22μH l 60 75 90 mA tOFF Timer (VIN = 3.3V, VOUT = 5V) Varies by 1/(VOUT – VIN) 225 400 550 ns Zero Current Comparator Threshold L = 22μH 0 mA Main NMOS Switch On-Resistance VOUT = 5V 2.8 Ω Leakage Current VSWITCH = 10V, VOUT = 10V 0.01 1 μA Main PMOS Switch On-Resistance VOUT = 5V 4.2 Ω Leakage Current VIN = 5V, VSWITCH = 5V, VOUT = 0V 0.02 2 μA Logic Inputs SHDN Threshold (Rising Edge) 0.3 1 V SHDN Hysteresis 80 mV SHDN Input Leakage Current SHDN = 3.3V 0 50 nA The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. VIN = 3.3V, VOUT = 5V, unless otherwise noted. Note 3: This IC includes overtemperature protection that is intended to protect the device during momentary overload conditions. Junction temperature will exceed 125°C when overtemperature protection is active. Continuous operation above the specified maximum operating junction temperature may impair device reliability. |
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