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CL05A475MP5NRNC Datasheet(PDF) 2 Page - Samsung semiconductor |
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CL05A475MP5NRNC Datasheet(HTML) 2 Page - Samsung semiconductor |
2 / 2 page Vibration Test Capacitance change : within ±5% Amplitude : 1.5mm Tan δ, IR : initial spec. From 10㎐ to 55㎐ (return : 1min.) 2hours × 3 direction (x, y, z) Moisture Capacitance change : within ±12.5% With rated voltage Resistance Tan δ 0.25 max 40±2℃, 90~95%RH, 500+12/-0hrs IR : 8.8㏁·㎌ or Over High Temperature Capacitance change : within ±12.5% With of the rated voltage Resistance Tan δ 0.25 max Max. operating temperature IR : 17.7㏁·㎌ or Over 1000+48/-0hrs Temperature Capacitance change : within ±10% 1 cycle condition Cycling Tan δ, IR : initial spec. Min. operating temperature→ 25℃ → Max. operating temperature → 25℃ 5 cycle test C. Recommended Soldering method : Reflow ( Reflow Peak Temperature : 260+0/-5℃, 10sec. Max ) * For the more detail Specification, Please refer to the Samsung MLCC catalogue. 100% Judgement Test condition |
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