AC Programming Characteristics

Sym-

bol

Parameter

Test

Conditions*

(1)

Limit

Units

Min

Max

Address Setup Time

2

CE Setup Time

2

OE Setup Time

2

Data Setup Time

2

Address Hold Time

0

Data Hold Time

2

OE High to

Output Float Delay

(2)

0130

ns

2

2

PGM Program Pulse Width

(3)

47.5

52.5

Data Valid from OE

150

ns

Programming

50

ns

*AC Conditions of Test:

Input Rise and Fall Times (10% to 90%)..............20 ns

Input Pulse Levels...................................0.45V to 2.4V

Input Timing Reference Level...................0.8V to 2.0V

Output Timing Reference Level................0.8V to 2.0V

2. This parameter is only sampled and is not 100%

tested. Output Float is defined as the point where

data is no longer driven — see timing diagram.

3. Program Pulse width tolerance is 50

Atmel’s 27C516 Integrated

Product Identification Code

Codes

Pins

Hex

Data

A0 015-08 O7 O6 O5 O4 O3 O2 O1 O0

Manufacturer

0

0

0001111

0 001E

Device Type

1

0

1111001

0

00F2

Rapid Programming Algorithm

A 50

µs PGM pulse width is used to program. The address

raised to 13.0V. Each address is first programmed with

one 50

µs PGM pulse without verification. Then a verifica-

tion / reprogramming loop is executed for each address.

In the event a word fails to pass verification, up to 10 suc-

cessive 50

µs pulses are applied with a verification after

each pulse. If the word fails to verify after 10 pulses have

been applied, the part is considered failed. After the word

verifies properly, the next address is selected until all have

5.0V. All words are read again and compared with the

original data to determine if the device passes or fails.

AT27C516

3-151