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AT27C256R-70PC Datasheet(PDF) 7 Page - ATMEL Corporation |
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AT27C256R-70PC Datasheet(HTML) 7 Page - ATMEL Corporation |
7 / 9 page AC Programming Characteristics TA = 25 ± 5°C, VCC = 6.5 ± 0.25V, VPP = 13.0 ± 0.25V Sym- bol Parameter Test Conditions* (1) Limits Units Min Max tAS Address Setup Time 2 µs tOES OE Setup Time 2 µs tDS Data Setup Time 2 µs tAH Address Hold Time 0 µs tDH Data Hold Time 2 µs tDFP OE High to Out- put Float Delay (2) 0130 ns tVPS VPP Setup Time 2 µs tVCS VCC Setup Time 2 µs tPW CE Program Pulse Width (3) 95 105 µs tOE Data Valid from OE (2) 150 ns tPRT VPP Pulse Rise Time During Programming 50 ns *AC Conditions of Test: Input Rise and Fall Times (10% to 90%)..............20 ns Input Pulse Levels...................................0.45V to 2.4V Input Timing Reference Level...................0.8V to 2.0V Output Timing Reference Level................0.8V to 2.0V Notes: 1. VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP. 2. This parameter is only sampled and is not 100% tested. Output Float is defined as the point where data is no longer driven — see timing diagram. 3. Program Pulse width tolerance is 100 µsec ± 5%. Atmel’s 27C256R Integrated Product Identification Code Codes Pins Hex Data A0 O7 O6 O5 O4 O3 O2 O1 O0 Manufacturer 00 0011110 1E Device Type 11 00011008C Rapid Programming Algorithm A 100 µs CE pulse width is used to program. The address is set to the first location. VCC is raised to 6.5V and VPP is raised to 13.0V. Each address is first programmed with one 100 µs CE pulse without verification. Then a verifica- tion/reprogramming loop is executed for each address. In the event a byte fails to pass verification, up to 10 succes- sive 100 µs pulses are applied with a verification after each pulse. If the byte fails to verify after 10 pulses have been applied, the part is considered failed. After the byte verifies properly, the next address is selected until all have been checked. VPP is then lowered to 5.0V and VCC to 5.0V. All bytes are read again and compared with the origi- nal data to determine if the device passes or fails. AT27C256R 3-131 |
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