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ZSC31150FEC-T Datasheet(PDF) 9 Page - List of Unclassifed Manufacturers |
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ZSC31150FEC-T Datasheet(HTML) 9 Page - List of Unclassifed Manufacturers |
9 / 24 page ZSC31150 Fast Automotive Sensor Signal Conditioner Data Sheet August 31, 2010 © 2010 Zentrum Mikroelektronik Dresden AG — Rev. 1.07 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 9 of 24 No. Parameter Symbol Conditions Min Typ Max Unit 1.3.7.6 Ratiometricity Error REOUT_5 maximum error of VDDE=5V to 4.5/5.5V 1000 ppm 1.3.7.7 Overall failure (deviation from ideal line including INL, gain, offset & temp errors) FALL TQI FALL TQA FALL TQE 13Bit 2 nd order ADC, fCLK<=3MHz, XZC=0 1, no sensor caused effects; inside of parenthesis: digital readout 0.25 (0.1) 0.5 (0.25) 1.0 (0.5) % FS 1.4. Interface Characteristics & EEPROM No. Parameter Symbol Conditions Min Typ Max Unit 1.4.1. I²C TM Interface (refer 'ZSC31150 Functional Description' for timing details) 1.4.1.1 Input-High-Level 2 VI²C_IN_H 0.8 VDDA 1.4.1.2 Input-Low-Level 2 VI²C_IN_L 0.2 VDDA 1.4.1.3 Output-Low-Level 2 VI²C_OUT_L Open Drain, IOL<2mA 0.15 VDDA 1.4.1.4 SDA load capacitance 2 CSDA 400 pF 1.4.1.5 SCL clock frequency 2 fSCL 400 kHz 1.4.1.6 Internal pull-up resistor 2 RI²C 25 100 k 1.4.2. ZACwire™ One Wire Interface (OWI) 1.4.2.1 Input-Low-Level 2 VOWI_IN_L 0.2 VDDA 1.4.2.2 Input-High-Level 2 VOWI_IN_H 0.75 VDDA 1.4.2.3 Output-Low-Level 2 VOWI_OUT_L Open Drain, IOL<2mA t.b.d. VDDA 1.4.2.4 Start Window 2 typ: @ fCLK=3MHz 96 175 455 ms 1.4.3. EEPROM 1.4.3.1 Ambient temperature EEPROM programming 2 TAMB_EEP -40 150 C 1.4.3.2 Write cycles 2 nWRI_EEP @write <= 85°C @write up to 150°C 100k 100 1.4.3.3 Read cycles 2 nREAD_EEP <=175°C 3 8 * 10 8 1.4.3.4 Data retention 2 tRET_EEP 1300h @ 175°C 4 (=100000h@55°C & 27000h@125°C & 3000h@150°C) 15 a 1.4.3.5 Programming time 2 tWRI_EEP per written word, fCLK=3MHz 12 ms 1 XZC is active: additional overall failure of 25ppm/K for XZC=31 in maximum, failure decreases linear for XZC adjusts lower than 31 2 No measurement in mass production, parameter is guaranteed by design and/or quality observation. 3 valid for the dice, notice additional package and temperature version caused restrictions 4 over lifetime and valid for the dice, use calculation sheet 'ZMDI Temperature Profile Calculation Sheet' for temperature stress calculation, notice additional package and temperature version caused restrictions |
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