LM5070

SNVS308G – OCTOBER 2004 – REVISED APRIL 2013

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Absolute Maximum Ratings

(1) (2)

-0.3V to 80V

-12V to 0V

-0.3V to 57V

UVLORTN

-0.3V to 13V

-0.3V to 7V

ARTN to RTN

-0.3V to 0.3V

-0.3V to 16V

All other inputs to ARTN

-0.3V to 7V

ESD Rating

Human Body Model

2000V

Storage Temperature

-65°C to +150°C

Junction Temperature

150°C

Wave (4 seconds)

260°C

Infrared (10 seconds)

240°C

Vapor Phase (75 seconds)

219°C

(1)

Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which

operation of the device is intended to be functional. For specifications and test conditions, see the Electrical Characteristics. The

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and

specifications.

(3)

For detailed information on soldering plastic TSSOP and WSON packages, see the Packaging Databook available from TI.

Operating Ratings

1.8V to 75V

8.1V to 15V

Operating Junction Temperature

-40°C to +125°C

Electrical Characteristics

(1)

Symbol

Parameter

Conditions

Min

Typ

Max

Units

Powered Interface

IOS

Offset Current

10

uA

VCLSS(ON)

Signature Resistor Disable /

10.0

11.5

12.5

V

Classification Current Turn On

VCLSS(OFF)

Classification Current Turn Off

20.5

22.0

23.0

V

Classification Voltage

1.43

1.5

1.57

V

ICLASS

Supply Current During

0.5

1.0

mA

Classification

IDC

Supply Current During Normal

OUT floating

1

1.9

mA

Operation

UVLO Pin Reference Voltage

1.95

2.00

2.05

V

UVLO Hysteresis Current

8.0

10

11.5

uA

Softstart Release

RTN falling with respect to

1.2

1.45

1.7

V

Softstart Release Hysteresis

RTN rising with respect to

0.8

1.1

1.3

V

RDS(ON)

PowerFET Resistance

I = 350mA,

1

2.2

Ω

ILEAK

SMPS Bias Current

100

uA

ILIM

Default Current Limit

350

390

420

mA

Temp = 0°C to 85°C

(1)

Min and Max limits are 100% production tested at 25 °C. Limits over the operating temperature range are specified through correlation

using Statistical Quality Control (SQC) methods. Limits are used to calculate Average Outgoing Quality Level (AOQL).

4

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