HEF4094BTD-T datasheet(11/20 Pages) PHILIPS

Part #	HEF4094BTD-T

Description	8-stage shift-and-store register

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Manufacturer	PHILIPS [NXP Semiconductors]

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HEF4094B

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Product data sheet

Rev. 11 — 29 August 2013

11 of 20

NXP Semiconductors

HEF4094B

8-stage shift-and-store register

a. Input waveform

b. Test circuit

Test data is given in Table 10.

Definitions for test circuit:

DUT = Device Under Test.

CL = load capacitance including jig and probe capacitance.

RL = load resistance.

RT = termination resistance should be equal to the output impedance Zo of the pulse generator.

Fig 11. Test circuit

VM

tW

10 %

90 %

10 %

90 %

0 V

VI

negative

pulse

positive

pulse

0 V

VM

90 %

10 %

90 %

10 %

tf

tr

tf

001aaj781

001aaj915

VEXT

VDD

VI

VO

DUT

CL

RT

RL

G

Table 10.

Test data

Supply voltage

Input

VEXT

Load

VDD

VI

tr, tf

tPHL, tPLH

tPHZ, tPZH

tPLZ, tPZL

CL

RL

5 V to 15 V

VSS or VDD

 20 ns

open

VSS

VDD

50 pF

1 k



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HEF4094BTD-T Datasheet(PDF) 11 Page - NXP Semiconductors

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