MACH211SP-15VC datasheet(10/37 Pages) AMD

Part #	MACH211SP-15VC

Description	High-Density EE CMOS Programmable Logic

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Manufacturer	AMD [Advanced Micro Devices]

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10

MACH211SP-7/10 (Com’l)

ABSOLUTE MAXIMUM RATINGS

Storage Temperature . . . . . . . . . . . . –65

°C to +150°C

Ambient Temperature

with Power Applied. . . . . . . . . . . . . . –55

°C to +125°C

Supply Voltage with

Respect to Ground . . . . . . . . . . . . . . . –0.5 V to +7.0 V

DC Input Voltage . . . . . . . . . . . . –0.5 V to VCC + 0.5 V

DC Output or

I/O Pin Voltage . . . . . . . . . . . . . .–0.5 V to VCC + 0.5 V

Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V

Latchup Current (TA = 0°C to 70°C) . . . . . . . . 200 mA

Stresses above those listed under Absolute Maximum

Ratings may cause permanent device failure. Functionality at

or above these limits is not implied. Exposure to Absolute

Maximum Ratings for extended periods may affect device

reliability. Programming conditions may differ.

OPERATING RANGES

Commercial (C) Devices

Ambient Temperature (TA)

Operating in Free Air. . . . . . . . . . . . . . . .0

°C to +70°C

Supply Voltage (VCC)

with Respect to Ground . . . . . . . . +4.75 V to +5.25 V

Operating ranges deﬁne those limits between which the

functionality of the device is guaranteed.

DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise speciﬁed

Notes:

1. These are absolute values with respect to device ground and all overshoots due to system and/or tester noise are included.

2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).

3. Not more than one output should be shorted at a time. Duration of the short-circuit should not exceed one second.

VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.

4. This parameter is measured in low-power mode with a 16-bit up/down counter pattern. This pattern is programmed in each

PAL block and is capable of being loaded, enabled and reset.

5. This parameter is not 100% tested, but is evaluated at initial characterization and at any time the design is modiﬁed where

capacitance may be affected.

Parameter

Symbol

Parameter Description

Test Conditions

Min

Typ

Max

Unit

VOH

Output HIGH Voltage

IOH = –3.2 mA, VCC = Min, VIN = VIH or VIL

2.4

V

VOL

Output LOW Voltage

IOL = 16 mA, VCC = Min, VIN = VIH or VIL

0.5

V

VIH

Input HIGH Voltage

Guaranteed Input Logical HIGH

Voltage for all Inputs (Note 1)

2.0

V

VIL

Input LOW Voltage

Guaranteed Input Logical LOW

Voltage for all Inputs (Note 1)

0.8

V

IIH

Input HIGH Current

VIN = 5.25 V, VCC = Max (Note 2)

10

µA

IIL

Input LOW Current

VIN = 0 V, VCC = Max (Note 2)

–10

µA

IOZH

Off-State Output Leakage

Current HIGH

VOUT = 5.25 V, VCC = Max

VIN = VIH or VIL (Note 2)

10

µA

IOZL

Off-State Output Leakage

Current LOW

VOUT = 0 V, VCC = Max

VIN = VIH or VIL (Note 2)

–10

µA

ISC

Output Short-Circuit Current

VOUT = 0.5 V, VCC = Max (Notes 3, 5)

–30

–160

mA

ICC

Supply Current (Static)

VCC = 5 V, TA = 25°C, f = 0 MHz (Note 4)

40

mA

Supply Current (Active)

VCC = 5 V, TA = 25°C, f = 1 MHz (Note 4)

45

mA

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