3

III. Reliability Stress Test Summary and Results

*Note: The reliability data presents total of available generic data up to the published date.

IV. Reliability Evaluation

FIT rate (per billion): 3.05

MTTF = 37419 years

The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in

sample size. Failure Rate Determination is based on JEDEC Standard JESD 85. FIT means one

failure per billion hours.

Failure Rate = Chi

MTTF = 10

Chi²= Chi Squared Distribution, determined by the number of failures and confidence interval

N = Total Number of units from burn-in tests

H = Duration of burn-in testing

Af = Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C)

Acceleration Factor ratio list:

55 deg C

70 deg C

85 deg C

100 deg C

115 deg C

130 deg C

150 deg C

Af

259

87

32

13

5.64

2.59

1

Tj s = Stressed junction temperature in degree (Kelvin), K = C+273.16

Tj u =The use junction temperature in degree (Kelvin), K = C+273.16

Test Item

Test Condition

Time

Point

Total

Sample

Size*

Number

of

Failures

Reference

Standard

MSL

Precondition

168hr 85°C / 85%RH +

3 cycle reflow@260°C

(MSL 1)

-

4389 pcs

0

JESD22-A113

HTGB

Temp = 150°C ,

Vgs=100% of Vgsmax

168 / 500 /

1000 hours

924 pcs

0

JESD22-A108

HTRB

Temp = 150°C ,

Vds=80% of Vdsmax

168 / 500 /

1000 hours

924 pcs

0

JESD22-A108

HAST

130°C , 85%RH,

33.3 psi,

Vds = 80% of Vdsmax

up to 42V

96 hours

924 pcs

0

JESD22-A110

H3TRB

85°C , 85%RH,

Vds = 80% of Vdsmax

up to 100V

1000 hours

693 pcs

0

JESD22-A101

Autoclave

121°C , 29.7psi,

RH=100%

96 hours

924 pcs

0

JESD22-A102

Temperature

Cycle

-65°C to 150°C ,

air to air,

250 / 500

cycles

924 pcs

0

JESD22-A104

Power

Cycling

Tj = 100°C

8572

cycles

924 pcs

0

AEC Q101