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LY61L1288WL-12 Datasheet(PDF) 5 Page - Lyontek Inc. |
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LY61L1288WL-12 Datasheet(HTML) 5 Page - Lyontek Inc. |
5 / 12 page LY61L1288 Rev. 1.5 128K X 8 BIT HIGH SPEED CMOS SRAM Lyontek Inc. reserves the rights to change the specifications and products without notice. 5F, No. 2, Industry E. Rd. IX, Science-Based Industrial Park, Hsinchu 300, Taiwan. TEL: 886-3-6668838 FAX: 886-3-6668836 4 ® CAPACITANCE (TA = 25 , f ℃ = 1.0MHz) PARAMETER SYMBOL MIN. MAX UNIT Input Capacitance CIN - 6 pF Input/Output Capacitance CI/O - 8 pF Note : These parameters are guaranteed by device characterization, but not production tested. AC TEST CONDITIONS Input Pulse Levels 0.2V to VCC -0.2V Input Rise and Fall Times 3ns Input and Output Timing Reference Levels 1.5V Output Load CL = 30pF + 1TTL, IOH/IOL = -4mA/8mA AC ELECTRICAL CHARACTERISTICS (1) READ CYCLE PARAMETER SYM. LY61L1288 -8 LY61L1288 -10 LY61L1288 -12 LY61L1288 -15 UNIT MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX. Read Cycle Time tRC 8 - 10 - 12 - 15 - ns Address Access Time tAA - 8 - 10 - 12 - 15 ns Chip Enable Access Time tACE - 8 - 10 - 12 - 15 ns Output Enable Access Time tOE -4-5 -6 - 7 ns Chip Enable to Output in Low-Z tCLZ* 2-2-3- 4 - ns Output Enable to Output in Low-Z tOLZ* 0-0-0- 0 - ns Chip Disable to Output in High-Z tCHZ* -4-5 -6 - 7 ns Output Disable to Output in High-Z tOHZ* -4-5 -6 - 7 ns Output Hold from Address Change tOH 3-3-3- 3 - ns (2) WRITE CYCLE PARAMETER SYM. LY61L1288 -8 LY61L1288 -10 LY61L1288 -12 LY61L1288 -15 UNIT MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX. Write Cycle Time tWC 8 - 10 - 12 - 15 - ns Address Valid to End of Write tAW 6.5 - 8 - 10 - 12 - ns Chip Enable to End of Write tCW 6.5 - 8 - 10 - 12 - ns Address Set-up Time tAS 0-0-0- 0 - ns Write Pulse Width tWP 6.5 - 8 - 9 - 10 - ns Write Recovery Time tWR 0-0-0- 0 - ns Data to Write Time Overlap tDW 5-6-7- 8 - ns Data Hold from End of Write Time tDH 0-0-0- 0 - ns Output Active from End of Write tOW* 1.5 - 2 - 3 - 4 - ns Write to Output in High-Z tWHZ* -5-6-7 - 8 ns *These parameters are guaranteed by device characterization, but not production tested. |
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