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ISO1176T Datasheet(PDF) 11 Page - Texas Instruments |
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ISO1176T Datasheet(HTML) 11 Page - Texas Instruments |
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11 / 27 page  D1 D2 tBBM 90 % 10 % 10% 90% t r_D t f_D t f_D t r_D tBBM D R DE VCC1 1 kW RE 54 W VCC2 GND1 VTEST GND2 CL=15 pF (includesprobeand jigcapacitance) A B GND 1 S1 2.0V 0.8V Success / failcriterion : stabileVOH orVOL outputs. V orV OH OL C=0.1 F ±1% m V orV OH OL C=0.1 F±1% m ISO1176T www.ti.com SLLSE28F – OCTOBER 2010 – REVISED OCTOBER 2012 PARAMETER MEASUREMENT INFORMATION (continued) Figure 20. Common-Mode Transient Immunity Test Circuit Figure 21. Transition Times and Break-Before-Make Time Delay for D1, D2 Outputs Copyright © 2010–2012, Texas Instruments Incorporated Submit Documentation Feedback 11 Product Folder Links :ISO1176T |
Similar Part No. - ISO1176T_13 |
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Similar Description - ISO1176T_13 |
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