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DS90CF384AMTDX Datasheet(PDF) 5 Page - Texas Instruments |
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DS90CF384AMTDX Datasheet(HTML) 5 Page - Texas Instruments |
5 / 19 page DS90CF364A, DS90CF384A www.ti.com SNLS040I – JUNE 2000 – REVISED APRIL 2013 (1) The worst case test pattern produces a maximum toggling of digital circuits, LVDS I/O and CMOS/TTL I/O. (2) The 16 grayscale test pattern tests device power consumption for a “typical” LCD display pattern. The test pattern approximates signal switching needed to produce groups of 16 vertical stripes across the display. (3) Figure 3 and Figure 5 show a falling edge data strobe (TxCLK IN/RxCLK OUT). (4) Recommended pin to signal mapping. Customer may choose to define differently. Figure 4. “16 Grayscale” Test Pattern (DS90CF384A) Copyright © 2000–2013, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: DS90CF364A DS90CF384A |
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