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V6207602-05XE Datasheet(PDF) 3 Page - Texas Instruments

Part # V6207602-05XE
Description  4 ppm100 A SOT23-6 SERIES VOLTAGE REFERENCES
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

V6207602-05XE Datasheet(HTML) 3 Page - Texas Instruments

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background image
1
GND_F
GND_S
3
2
ENABLE
5
6
4
OUT_S
IN
OUT_F
SOT23-6
(TOP VIEW)
REF3212-EP, REF3220-EP, REF3225-EP
REF3230-EP, REF3233-EP, REF3240-EP
www.ti.com
SBVS078B
– OCTOBER 2006 – REVISED AUGUST 2011
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Figure 1. PIN CONFIGURATION
A.
The location of pin 1 on the REF32xx is determined by orienting the package marking as shown.
PIN DESCRIPTIONS
PIN
NAME
NO.
FUNCTION
DESCRIPTION
ENABLE
3
Digital input
This pin enables and disables the device
GND_F
1
Analog output
Ground connection of the device
GND_S
2
Analog input
Ground sense at the load
IN
4
Analog input
Positive supply voltage
OUT_F
6
Analog output
Output of Reference Voltage
OUT_S
5
Analog input
Sense connection at the load
Absolute Maximum Ratings
(1)
MIN
MAX
UNIT
Input voltage
7.5
V
Output short-circuit
Continuous
Operating temperature range
–55
125
°C
Storage temperature range
–65
150(2)
°C
Junction temperature
150
°C
Human-Body Model
4
kV
ESD rating
Charged-Device Model
1
Machine Model
400
V
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2)
Long-term high-temperature storage and/or extended use at maximum recommended operating conditions may result in a reduction of
overall device life. See http://www.ti.com/ep_quality for additional information on enhanced plastic packaging.
Copyright
© 2006–2011, Texas Instruments Incorporated
Submit Documentation Feedback
3
Product Folder Link(s): REF3212-EP, REF3220-EP, REF3225-EP REF3230-EP, REF3233-EP, REF3240-EP


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