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LMH6624 Datasheet(PDF) 5 Page - Texas Instruments |
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LMH6624 Datasheet(HTML) 5 Page - Texas Instruments |
5 / 31 page LMH6624 www.ti.com SNOSA42F – NOVEMBER 2002 – REVISED MARCH 2013 ±6V Electrical Characteristics Unless otherwise specified, all limits ensured at TA = 25°C, V + = 6V, V− = −6V, V CM = 0V, AV = +20, RF = 500Ω, RL = 100Ω. Boldface limits apply at the temperature extremes. See (1). Symbol Parameter Conditions Min Typ Max Units (2) (3) (2) Dynamic Performance fCL −3dB BW VO = 400mVPP (LMH6624) 95 MHz VO = 400mVPP (LMH6626) 85 SR Slew Rate (4) VO = 2VPP, AV = +20 (LMH6624) 350 VO = 2VPP, AV = +20 (LMH6626) 320 V/ μs VO = 2VPP, AV = +10 (LMH6624) 400 VO = 2VPP, AV = +10 (LMH6626) 360 tr Rise Time VO = 400mV Step, 10% to 90% 3.7 ns tf Fall Time VO = 400mV Step, 10% to 90% 3.7 ns ts Settling Time 0.1% VO = 2VPP (Step) 18 ns Distortion and Noise Response en Input Referred Voltage Noise f = 1MHz (LMH6624) 0.92 nV/ √Hz f = 1MHz (LMH6626) 1.0 in Input Referred Current Noise f = 1MHz (LMH6624) 2.3 pA/ √Hz f = 1MHz (LMH6626) 1.8 HD2 2nd Harmonic Distortion fC = 10MHz, VO = 1VPP, RL 100Ω −63 dBc HD3 3rd Harmonic Distortion fC = 10MHz, VO = 1VPP, RL 100Ω −80 dBc Input Characteristics VOS Input Offset Voltage VCM = 0V −0.5 ±0.10 +0.5 mV −0.7 +0.7 Average Drift (5) VCM = 0V ±0.2 μV/°C IOS Input Offset Current Average Drift (LMH6624) −1.1 0.05 1.1 μA (5) VCM = 0V −2.5 2.5 (LMH6626) −2.0 0.1 2.0 VCM = 0V −2.5 2.5 VCM = 0V 0.7 nA/°C IB Input Bias Current VCM = 0V 13 +20 μA +25 Average Drift (5) VCM = 0V 12 nA/°C RIN Input Resistance (6) Common Mode 6.6 M Ω Differential Mode 4.6 k Ω CIN Input Capacitance (6) Common Mode 0.9 pF Differential Mode 2.0 CMRR Common Mode Rejection Ratio Input Referred, dB VCM = −4.5 to +5.25V 90 95 VCM = −4.5 to +5.0V 87 Transfer Characteristics AVOL Large Signal Voltage Gain (LMH6624) 77 81 RL = 100Ω, VO = −3V to +3V 72 dB (LMH6626) 74 80 RL = 100Ω, VO = −3V to +3V 70 (1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. Absolute maximum ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically. (2) All limits are specified by testing or statistical analysis. (3) Typical Values represent the most likely parametric norm. (4) Slew rate is the slowest of the rising and falling slew rates. (5) Average drift is determined by dividing the change in parameter at temperature extremes into the total temperature change. (6) Simulation results. Copyright © 2002–2013, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: LMH6624 |
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