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SN54ABTH182652A Datasheet(PDF) 2 Page - Texas Instruments |
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SN54ABTH182652A Datasheet(HTML) 2 Page - Texas Instruments |
2 / 39 page SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A SCAN TEST DEVICES WITH 18BIT BUS TRANSCEIVERS AND REGISTERS SCBS167D − AUGUST 1993 − REVISED JULY 1996 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251−1443 18 19 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 20 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 21 22 23 24 63 62 61 60 59 64 58 56 55 54 57 25 26 27 28 29 53 52 17 51 50 49 30 31 32 1A3 1A4 1A5 GND 1A6 1A7 1A8 1A9 VCC 2A1 2A2 2A3 GND 2A4 2A5 2A6 1B4 1B5 1B6 GND 1B7 1B8 1B9 VCC 2B1 2B2 2B3 2B4 GND 2B5 2B6 2B7 SN74ABTH18652A, SN74ABTH182652A...PM PACKAGE (TOP VIEW) description The ’ABTH18652A and ’ABTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE bus transceivers and registers. Data flow in each direction is controlled by clock (CLKAB and CLKBA), select (SAB and SBA), and output-enable (OEAB and OEBA) inputs. For A-to-B data flow, data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B data flow, but uses CLKBA, SBA, and OEBA inputs. Since the OEBA input is active-low, the A outputs are active when OEBA is low and are in the high-impedance state when OEBA is high. Figure 1 illustrates the four fundamental bus-management functions that are performed with the ’ABTH18652A and ’ABTH182652A. |
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