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CRCW0201147RFKED Datasheet(PDF) 3 Page - Vishay Siliconix

Part # CRCW0201147RFKED
Description  Lead (Pb)-free Commodity Thick Film Chip Resistors
Download  6 Pages
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Manufacturer  VISHAY [Vishay Siliconix]
Direct Link  http://www.vishay.com
Logo VISHAY - Vishay Siliconix

CRCW0201147RFKED Datasheet(HTML) 3 Page - Vishay Siliconix

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CRCW0201 e3
www.vishay.com
Vishay
Revision: 06-Jun-12
3
Document Number: 20052
For technical questions, contact: thickfilmchip@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
DERATING
TEST PROCEDURES AND REQUIREMENTS
EN 60115-1
CLAUSE
IEC
60068-2
TEST
METHOD
TEST
PROCEDURE
REQUIREMENTS
PERMISSIBLE CHANGE (
R)
Stability for product types:
CRCW0201 e3
1
 to 10 M
4.5
-
Resistance
-
± 0.5 %; ± 1 %; ± 5 %
4.7
-
Voltage proof
U = 1.4 x Uins; 60 s
No flashover or breakdown
4.13
58 (Td)
Solderability
Solder bath method;
Sn60Pb40
non activated flux;
(235 ± 5) °C
(2 ± 0.2) s
Good tinning (
 95 % covered)
no visible damage
Solder bath method;
Sn96.5Ag3Cu0.5
non-activated flux;
(245 ± 5) °C
(3 ± 0.3) s
Good tinning (
 95 % covered)
no visible damage
4.8.4.2
-
Temperature coefficient
(20/- 55/20) °C and
(20/125/20) °C
± 100 ppm/K,
± 200 ppm/K,
- 200 ppm/K/+ 400 ppm/K
4.32
21 (Uu3)
Shear
(adhesion)
9 N
No visible damage
4.33
21 (Uu1)
Substrate bending
Depth 2 mm;
3 times
No visible damage,
no open circuit in bent position
± (0.5 % R + 0.05
)
4.19
14 (Na)
Rapid change of temperature
30 min. at - 55 °C;
30 min. at 125 °C
5 cycles
± (0.5 % R + 0.05
)
1000 cycles
± (1 % R + 0.05
)
- 50
0
50
100
150
0
Ambient Temperature
amb in °C
50
100
70
ϑ


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