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REF5020IDR Datasheet(PDF) 2 Page - Texas Instruments |
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REF5020IDR Datasheet(HTML) 2 Page - Texas Instruments |
2 / 28 page REF5010, REF5020 REF5025, REF5030 REF5040, REF5045, REF5050 SBOS410E – JUNE 2007 – REVISED JUNE 2010 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1) PRODUCT OUTPUT VOLTAGE PACKAGE-LEAD PACKAGE DESIGNATOR PACKAGE MARKING STANDARD GRADE (8ppm, 0.1%) SO-8 D REF5020 REF5020A 2.048V MSOP-8 DGK R50A SO-8 D REF5025 REF5025A 2.5V MSOP-8 DGK R50B SO-8 D REF5030 REF5030A 3.0V MSOP-8 DGK R50C SO-8 D REF5040 REF5040A 4.096V MSOP-8 DGK R50D SO-8 D REF5045 REF5045A 4.5V MSOP-8 DGK R50E SO-8 D REF5050 REF5050A 5.0V MSOP-8 DGK R50F SO-8 D REF5010 REF5010A 10.0V MSOP-8 DGK R50G HIGH GRADE (3ppm, 0.05%) SO-8 D REF5020 REF5020I 2.048V MSOP-8 DGK R50A SO-8 D REF5025 REF5025I 2.5V MSOP-8 DGK R50B SO-8 D REF5030 REF5030I 3.0V MSOP-8 DGK R50C SO-8 D REF5040 REF5040I 4.096V MSOP-8 DGK R50D SO-8 D REF5045 REF5045I 4.5V MSOP-8 DGK R50E SO-8 D REF5050 REF5050I 5.0V MSOP-8 DGK R50F SO-8 D REF5010 REF5010I 10.0V MSOP-8 DGK R50G (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the device product folder at www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) PARAMETER REF50xx UNIT Input Voltage +18 V Output Short-Circuit 30 mA Operating Temperature Range –55 to +125 °C Storage Temperature Range –65 to +150 °C Junction Temperature (TJ max) +150 °C Human Body Model (HBM) 3000 V ESD Rating Charged Device Model (CDM) 1000 V (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. 2 Submit Documentation Feedback Copyright © 2007–2010, Texas Instruments Incorporated Product Folder Link(s): REF5010 REF5020 REF5025 REF5030 REF5040 REF5045 REF5050 |
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