NXP Semiconductors

PBSS5260QA

60 V, 1.7 A PNP low VCEsat (BISS) transistor

PBSS5260QA

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Product data sheet

28 August 2013

11 / 17

11. Test information

006aaa266

input pulse

(idealized waveform)

90 %

10 %

90 %

10 %

output pulse

(idealized waveform)

t

Fig. 16. BISS transistor switching time definition

R2

R1

DUT

mgd624

(probe)

450 Ω

(probe)

450 Ω

oscilloscope

oscilloscope

Fig. 17. Test circuit for switching times

11.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.