TPS65282

SW_OUT1

AGND

RLIM

SW_OUT2

nFALUT1

nFALUT2

PGND

PGND

VIN

VIN

PGOOD

V7V

VIN=5V

+2.5V

USB Data

USB

Port 1

USB Data

USB

Port 2

USB2 control signal

Enable

USB1 fault signal

USB2 fault signal

C2

1uF

C6

47nF

C1

10uF

C8

10uF

C9

10uF

R1

100kΩ

C4

4.7nF

C7

22uF

R4

10kΩ

19

20

21

22

23

24

12

11

10

9

8

7

USB1 control signal

R2

100kΩ

L1

4.7uH

Analog Ground

Power Ground

R3

40.2kΩ

R4

18.9kΩ

V7V

VIN=5V

TPS65282

SW_OUT1

AGND

RLIM

SW_OUT2

nFALUT1

nFALUT2

PGND

PGND

VIN

VIN

PGOOD

V7V

VIN

6V-18V

+5V

USB Data

USB

Port 1

USB Data

USB

Port 2

USB2 control signal

Enable

USB1 fault signal

USB2 fault signal

C2

1uF

C6

47nF

C1

10uF

C8

10uF

C9

10uF

R1

100kΩ

C4

4.7nF

C7

22uF

R4

10kΩ

19

20

21

22

23

24

12

11

10

9

8

7

USB1 control signal

R2

100kΩ

L1

4.7uH

Analog Ground

Power Ground

R3

40.2kΩ

R4

7.68kΩ

V7V

TPS65282

www.ti.com

SLVSBU5 – MARCH 2013

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

TYPICAL APPLICATION

Figure 1. 12-V Power Bus

Figure 2. 5-V Power Bus

Copyright © 2013, Texas Instruments Incorporated

Submit Documentation Feedback

3

Product Folder Links: TPS65282