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ISL8704AIBZ Datasheet(PDF) 2 Page - Intersil Corporation |
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ISL8704AIBZ Datasheet(HTML) 2 Page - Intersil Corporation |
2 / 12 page 2 FN6381.0 October 12, 2006 Absolute Maximum Ratings Thermal Information VIN, ENABLE(#), FAULT . . . . . . . . . . . . . . . . . . . . . . . 27V, to -0.3V TIME, TB, TC, TD, UV, OV . . . . . . . . . . . . . . . . . . . . . +6V, to -0.3V SEQ_EN(#) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VIN+0.3V, to -0.3V ENABLE, ENABLE # Output Current . . . . . . . . . . . . . . . . . . . 10mA Operating Conditions Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . .-40°C to +85°C Supply Voltage Range (Nominal). . . . . . . . . . . . . . . . . . 3.3V to 24V Thermal Resistance (Typical, Note 2) θJA (°C/W) 14 Ld SOIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110 Maximum Junction Temperature (Plastic Package) . . . . . . . +125°C Maximum Storage Temperature Range . . . . . . . . . . -65°C to +150°C Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . +300°C (SOIC Lead Tips Only) CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 2. θ JA is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details. Electrical Specifications Nominal VIN = 3.3V to +24V, TA = TJ = -40°C to+85°C, Unless Otherwise Specified. PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT UV AND OV INPUTS UV/OV Rising Threshold VUVRvth 1.16 1.21 1.28 V UV/OV Falling Threshold VUVFvth 1.06 1.10 1.18 V UV/OV Hysteresis VUVhys VUVRvth - VUVFvth -104 - mV UV/OV Input Current IUV -10 - nA TIME, ENABLE/ENABLE# OUTPUTS TIME Pin Charging Current ITIME -2.6 - μA TIME Pin Threshold VTIME_VTH 1.9 2.0 2.25 V Time from VIN Valid to ENABLE_A tVINSEQpd SEQ_EN = high, CTIME = open - 30 - μs tVINSEQpd_10 SEQ_EN = high, CTIME = 10nF - 7.7 - ms tVINSEQpd500 SEQ_EN = high, CTIME = 500nF - 435 - ms Time from VIN Invalid to Shutdown tshutdown UV or OV to simultaneous shutdown - - 1 μs ENABLE Output Resistance REN IENABLE = 1mA - 100 - Ω ENABLE Output Low Vol IENABLE = 1mA - 0.1 - V ENABLE Pull-down Current Ipulld ENABLE = 1V 10 15 - mA Delay to Subsequent ENABLE Turn-on/off tdel_120 RTX = 120kΩ 155 195 240 ms tdel_3 RTX = 3kΩ 3.5 4.7 6 ms tdel_0 RTX = 0Ω -0.5 - ms SEQUENCE ENABLE AND FAULT I/O VIN Valid to FAULT Low tFLTL 15 30 50 μs VIN Invalid to FAULT High tFLTH -0.5 - μs FAULT Pull-down Current FAULT = 1V 10 15 - mA SEQ_EN Pull-up Voltage VSEQ SEQ_EN open - 2.4 - V SEQ_EN Low Threshold Voltage VilSEQ_EN -- 0.3 V SEQ_EN High Threshold Voltage VihSEQ_EN 1.2 - - V Delay to ENABLE_A Deasserted tSEQ_EN_ENA SEQ_EN low to ENABLE_A low - 0.2 1 μs BIAS IC Supply Current IVIN_3.3V VIN = 3.3V - 191 - μA IVIN_12V VIN = 12V - 246 400 μA IVIN_24V VIN = 24V - 286 - μA VIN Power On Reset VIN_POR VIN low to high - 2.3 2.8 V ISL8700A, ISL8701A, ISL8702A, ISL8703A, ISL8704A, ISL8705A |
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