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MCP1725-5002ESN Datasheet(PDF) 6 Page - Microchip Technology

Part # MCP1725-5002ESN
Description  500 mA, Low Voltage, Low Quiescent Current LDO Regulator
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Manufacturer  MICROCHIP [Microchip Technology]
Direct Link  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MCP1725-5002ESN Datasheet(HTML) 6 Page - Microchip Technology

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MCP1725
DS22026B-page 6
© 2007 Microchip Technology Inc.
Dropout Characteristics
Dropout Voltage
VIN-VOUT
210
350
mV
IOUT = 500 mA, (Note 5)
VIN(MIN) =2.3V
Power Good Characteristics
PWRGD Input Voltage Operat-
ing Range
VPWRGD_VIN
1.0
6.0
V
TA = +25°C
1.2
6.0
TA = -40°C to +125°C
For VIN < 2.3V, ISINK = 100 µA
PWRGD Threshold Voltage
(Referenced to VOUT)
VPWRGD_TH
——
%VOUT Falling Edge
89
92
95
VOUT < 2.5V Fixed, VOUT =
Adj.
90
92
94
VOUT >= 2.5V Fixed
PWRGD Threshold Hysteresis
VPWRGD_HYS
1.0
2.0
3.0
%VOUT
PWRGD Output Voltage Low
VPWRGD_L
—0.2
0.4
VIPWRGD SINK = 1.2 mA,
ADJ = 0V, SENSE = 0V
PWRGD Leakage
PWRGD_LK
—1
nA
VPWRGD = VIN = 6.0V
PWRGD Time Delay
TPG
Rising Edge
RPULLUP = 10 kΩ
ICDELAY = 140 nA (Typ)
200
µs
CDELAY = OPEN
10
30
55
ms
CDELAY =0.01µF
300
ms
CDELAY =0.1 µF
Detect Threshold to PWRGD
Active Time Delay
TVDET-PWRGD
200
µs
VADJ or VSENSE =
VPWRGD_TH + 20 mV to
VPWRGD_TH - 20 mV
Shutdown Input
Logic High Input
VSHDN-HIGH
45
——
%VIN
VIN = 2.3V to 6.0V
Logic Low Input
VSHDN-LOW
——
15
%VIN
VIN = 2.3V to 6.0V
SHDN Input Leakage Current
SHDNILK
-0.1
±0.001
+0.1
µA
VIN =6V, SHDN =VIN,
SHDN = GND
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise noted, V
IN = VOUT(MAX) + VDROPOUT(MAX) (Note 1), VR = 1.8V for Adjustable Output,
IOUT = 1 mA, CIN = COUT = 4.7 µF (X7R Ceramic), TA = +25°C.
Boldface type applies for junction temperatures, T
J (Note 7) of -40°C to +125°C
Parameters
Sym
Min
Typ
Max
Units
Conditions
Note 1:
The minimum VIN must meet two conditions: VIN ≥ 2.3V and VIN ≥ VOUT(MAX) + VDROPOUT(MAX).
2:
VR is the nominal regulator output voltage for the fixed cases. VR = 1.2V, 1.8V, etc. VR is the desired set point output
voltage for the adjustable cases. VR = VADJ * ((R1/R2)+1). Figure 4-1.
3:
TCVOUT = (VOUT-HIGH – VOUT-LOW) *10
6 / (V
R * ΔTemperature). VOUT-HIGH is the highest voltage measured over the
temperature range. VOUT-LOW is the lowest voltage measured over the temperature range.
4:
Load regulation is measured at a constant junction temperature using low duty-cycle pulse testing. Load regulation is
tested over a load range from 1 mA to the maximum specified output current.
5:
Dropout voltage is defined as the input-to-output voltage differential at which the output voltage drops 2% below its
nominal value that was measured with an input voltage of VOUT = VR + VDROPOUT(MAX).
6:
The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable junction
temperature and the thermal resistance from junction to air. (i.e., TA, TJ, θJA). Exceeding the maximum allowable power
dissipation will cause the device operating junction temperature to exceed the maximum +150°C rating. Sustained
junction temperatures above +150°C can impact device reliability.
7:
The junction temperature is approximated by soaking the device under test at an ambient temperature equal to the
desired junction temperature. The test time is small enough such that the rise in the junction temperature over the
ambient temperature is not significant.


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