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ERB1885C2E100JDX5D Datasheet(PDF) 9 Page - Murata Manufacturing Co., Ltd.

Part # ERB1885C2E100JDX5D
Description  Application Spec ifi c Capacitors High Frequency Ceramic Capacitors
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Manufacturer  MURATA [Murata Manufacturing Co., Ltd.]
Direct Link  http://www.murata.com
Logo MURATA - Murata Manufacturing Co., Ltd.

ERB1885C2E100JDX5D Datasheet(HTML) 9 Page - Murata Manufacturing Co., Ltd.

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Specifications and Test Methods
ERB Series
Item
Specifications
Test Method
Operating Temperature
55°C to 125°C
Reference Temperature: 25
Appearance
No defects or abnormalities.
Visual inspection.
Dimension
Within the specified dimensions.
Using calipers.
Dielectric Strength
No defects or abnormalities.
300%* of the rated voltage
*250V/300V: 250%, 500V: 200%
Insulation Resistance
1,000,000M min.(C 470pF)
100,000 M min. (C 470pF)
C: Nominal capacitance (pF)
DC voltage not exceeding the rated voltage at 25°C
and 75%RH max. and within 2 minutes of charging.
Q
C 220pF: Q 10,000
Frequency 1±0.1MHz
220pF C 470pF: Q 5,000
Voltage 1±0.2Vrms
470pF C 1000pF: Q 3,000
C: Nominal capacitance (pF)
Adhesive Strength of
Termination
No removal of the terminations or other
defect should occur.
Solder the capacitor to the test jig (glass epoxy
board) then apply 10N force in parallel with the test
jig
for 10±1sec.
Vibration Resistance
Appearance: No defects or abnormalities.
Capacitance: Within the specified tolerance.
C 220pF: Q 10,000
220pF C 470pF: Q 5,000
470pF C 1000pF: Q 3,000
C: Nominal capacitance (pF)
Frequency range, from 10 to 55Hz and return to
10Hz, should be traversed in approximately 1 minute.
This motion should be applied for a period of 2 hours
in each of 3 mutually perpendicular directions total of
6
hours).
Deflection
No crack or marked defect should occur.
Flexure: 1mm
Solderability of Termination
95% of the terminations are to be soldered
evenly and continuously.
Immerse in eutectic solder solution for 5±0.5 seconds
at 245±5°C or Sn-3.0Ag-0.5Cu solder solution for
5±0.5 seconds at 245±5°C.
Resistance to Soldering Heat
Appearance: No marking defects
Capacitance Change: Within ±2.5% or
±0.25 pF (Whichever is larger)
C 220pF: Q 10,000
220pF C 470pF: Q 5,000
470pF C 1000pF: Q 3,000
C: Nominal capacitance (pF)
Immerse the capacitor in a eutectic solder solution or
Sn-3.0Ag-0.5Cu solder solution at 270±5°C for
10±0.5 seconds. Let sit at room temperature for
24±2 hours.
Temperature Cycle
Appearance: No marking defects
Capacitance Change: Within ±5% or
±0.5 pF (Whichever is larger)
C 220pF: Q 10,000
220pF C 470pF: Q 5,000
470pF C 1000pF: Q 3,000
C: Nominal capacitance (pF)
55 to 125 Five cycles
Humidity Steady State
Appearance: No marking defects
Capacitance Change: Within ±5% or
±0.5pF (Whichever is larger)
C 30pF: Q 350
10pF C<30pF: Q 275+ 5°C/2°C 10pF:
Q 200+10C
C: Nominal capacitance (pF)
Apply the 24-hour heat (-10 to +65 ) and humidity
(80 to 100%) treatment, 10 consecutive times.
High Temperature Load
Appearance: No marking defects
Capacitance Change: Within ±3% or
±0.3pF (Whichever is larger)
C 30pF: Q 350
10pF C<30pF: Q 275+5°C/2°C
10pF: Q 200+10°C
C: Nominal capacitance (pF)
Apply 200% (500V only 150%) of the rated voltage
for 1000±12 hours at the maximum operating
temperature ±3°C.
Specifications and Test Methods
ERB Series
Item
Specifications
Test Method
Operating Temperature
55°C to 125°C
Reference Temperature: 25
Appearance
No defects or abnormalities.
Visual inspection.
Dimension
Within the specified dimensions.
Using calipers.
Dielectric Strength
No defects or abnormalities.
300%* of the rated voltage
*250V/300V: 250%, 500V: 200%
Insulation Resistance
1,000,000M min.(C 470pF)
100,000 M min. (C 470pF)
C: Nominal capacitance (pF)
DC voltage not exceeding the rated voltage at 25°C
and 75%RH max. and within 2 minutes of charging.
Q
C 220pF: Q 10,000
Frequency 1±0.1MHz
220pF C 470pF: Q 5,000
Voltage 1±0.2Vrms
470pF C 1000pF: Q 3,000
C: Nominal capacitance (pF)
Adhesive Strength of
Termination
No removal of the terminations or other
defect should occur.
Solder the capacitor to the test jig (glass epoxy
board) then apply 10N force in parallel with the test
jig
for 10±1sec.
Vibration Resistance
Appearance: No defects or abnormalities.
Capacitance: Within the specified tolerance.
C 220pF: Q 10,000
220pF C 470pF: Q 5,000
470pF C 1000pF: Q 3,000
C: Nominal capacitance (pF)
Frequency range, from 10 to 55Hz and return to
10Hz, should be traversed in approximately 1 minute.
This motion should be applied for a period of 2 hours
in each of 3 mutually perpendicular directions total of
6
hours).
Deflection
No crack or marked defect should occur.
Flexure: 1mm
Solderability of Termination
95% of the terminations are to be soldered
evenly and continuously.
Immerse in eutectic solder solution for 5±0.5 seconds
at 245±5°C or Sn-3.0Ag-0.5Cu solder solution for
5±0.5 seconds at 245±5°C.
Resistance to Soldering Heat
Appearance: No marking defects
Capacitance Change: Within ±2.5% or
±0.25 pF (Whichever is larger)
C 220pF: Q 10,000
220pF C 470pF: Q 5,000
470pF C 1000pF: Q 3,000
C: Nominal capacitance (pF)
Immerse the capacitor in a eutectic solder solution or
Sn-3.0Ag-0.5Cu solder solution at 270±5°C for
10±0.5 seconds. Let sit at room temperature for
24±2 hours.
Temperature Cycle
Appearance: No marking defects
Capacitance Change: Within ±5% or
±0.5 pF (Whichever is larger)
C 220pF: Q 10,000
220pF C 470pF: Q 5,000
470pF C 1000pF: Q 3,000
C: Nominal capacitance (pF)
55 to 125 Five cycles
Humidity Steady State
Appearance: No marking defects
Capacitance Change: Within ±5% or
±0.5pF (Whichever is larger)
C 30pF: Q 350
10pF C<30pF: Q 275+ 5°C/2°C 10pF:
Q 200+10C
C: Nominal capacitance (pF)
Apply the 24-hour heat (-10 to +65 ) and humidity
(80 to 100%) treatment, 10 consecutive times.
High Temperature Load
Appearance: No marking defects
Capacitance Change: Within ±3% or
±0.3pF (Whichever is larger)
C 30pF: Q 350
10pF C<30pF: Q 275+5°C/2°C
10pF: Q 200+10°C
C: Nominal capacitance (pF)
Apply 200% (500V only 150%) of the rated voltage
for 1000±12 hours at the maximum operating
temperature ±3°C.
Specifications and Test Methods
The temperature coefficient is determined using the
capacitance measured in step 3 as a reference.
When cycling the temperature sequentially from
step 1 through 5 the capacitance should be within
the specified tolerance for the temperature coefficient
and capacitance change as in Table A-1. The
capacitance drift is calculated by dividing the
differences between the maximum and minimum
measured values in steps 1, 3 and 5 by the cap.
value in step 3.
Capacitance Change:
Within the specified tolerance. (Table A-1)
Temperature Coefficent:
Within the specified tolerance. (Table A-1)
Capacitance Drift: Within ±0.2% or
±0.5pF (Whichever is larger)
Capacitance
Temperature
Characteristics
Step
Temperature (°C)
1
25±2
2
-55±3
3
25±2
4
125±3
5
25±2
Applic Ation Sp E ci F ic cA pA cit o RS
High Frequency Ceramic Capacitors
ERB Specifications and Test Methods
52 – Innovator in Electronics
C-29-C
www .m
urata.com


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