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FQPF30N06L Datasheet(PDF) 5 Page - Fairchild Semiconductor |
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FQPF30N06L Datasheet(HTML) 5 Page - Fairchild Semiconductor |
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5 / 8 page  ©2001 Fairchild Semiconductor Corporation Rev. A1. May 2001 Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms Unclamped Inductive Switching Test Circuit & Waveforms Charge VGS 5V Qg Qgs Qgd 3mA VGS DUT VDS 300nF 50KΩ 200nF 12V Same Type as DUT Charge VGS 5V Qg Qgs Qgd 3mA VGS DUT VDS 300nF 50KΩ 200nF 12V Same Type as DUT VGS VDS 10% 90% t d(on) t r t on t off t d(off) t f VDD 5V VDS RL DUT RG VGS VGS VDS 10% 90% t d(on) t r t on t off t d(off) t f VDD 5V VDS RL DUT RG VGS EAS =L IAS 2 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG L I D t p EAS =L IAS 2 ---- 2 1 EAS =L IAS 2 ---- 2 1 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG L L I D I D t p |
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