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CY7C261-35LMB Datasheet(PDF) 3 Page - Cypress Semiconductor |
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CY7C261-35LMB Datasheet(HTML) 3 Page - Cypress Semiconductor |
3 / 16 page CY7C261 CY7C263/CY7C264 Document #: 38-04010 Rev. ** Page 3 of 16 ]] Electrical Characteristics Over the Operating Range[3,4] 7C261-20, 25 7C263-20, 25 7C264-20, 25 7C261-35, 45, 55 7C263-35, 45, 55 7C264-35, 45, 55 Parameter Description Test Conditions Min. Max. Min. Max. Unit VOH Output HIGH Voltage VCC = Min., IOH = –2.0 mA 2.4 V VOH Output HIGH Voltage VCC = Min., IOH = –4.0 mA 2.4 V VOL Output LOW Voltage VCC = Min., IOL = 8 mA (6 mA Mil) 0.4 V VOL Output LOW Voltage VCC = Min., IOL = 16 mA 0.4 V VIH Input HIGH Level 2.0 2.0 V VIL Input LOW Level 0.8 0.8 V IIX Input Current GND < VIN < VCC –10 +10 –10 +10 µA VCD Input Diode Clamp Voltage Note 4 Note 4 IOZ Output Leakage Current GND <VOUT < VCC Output Disabled Com’l –10 +10 –10 +10 µA Mil –40 +40 –40 +40 µA IOS Output Short Circuit Current[5] VCC = Max., VOUT = GND –20 –90 –20 –90 mA ICC Power Supply Current VCC = Max., f = Max. IOUT= 0 mA Com’l 120 100 mA Mil 140 120 ISB Standby Supply Current (7C261) VCC = Max., CS > VIH Com’l40 30 mA Mil 40 30 VPP Programming Supply Voltage 12 13 12 13 V IPP Programming Supply Current 50 50 mA VIHP Input HIGH Programming Voltage 4.75 4.75 V VILP Input LOW Programming Voltage 0.4 0.4 V Notes: 3. See the last page of this specification for Group A subgroup testing information. 4. See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing. 5. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.] Capacitance[4] Parameter Description Test Conditions Max. Unit CIN Input Capacitance TA = 25°C, f = 1 MHz, VCC = 5.0V 10 pF COUT Output Capacitance 10 pF |
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