CY7C261

CY7C263/CY7C264

Document #: 38-04010 Rev. **

Page 3 of 16

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7C261-20, 25

7C263-20, 25

7C264-20, 25

7C261-35, 45, 55

7C263-35, 45, 55

7C264-35, 45, 55

Parameter

Description

Test Conditions

Min.

Max.

Min.

Max.

Unit

Output HIGH Voltage

2.4

V

Output HIGH Voltage

2.4

V

Output LOW Voltage

(6 mA Mil)

0.4

V

Output LOW Voltage

0.4

V

Input HIGH Level

2.0

2.0

V

Input LOW Level

0.8

0.8

V

Input Current

–10

+10

–10

+10

µA

Input Diode Clamp Voltage

Note 4

Note 4

Output Leakage Current

Output Disabled

Com’l

–10

+10

–10

+10

µA

Mil

–40

+40

–40

+40

µA

Output Short Circuit Current[5]

–20

–90

–20

–90

mA

Power Supply Current

f = Max.

Com’l

120

100

mA

Mil

140

120

Standby Supply Current (7C261)

Com’l40

30

mA

Mil

40

30

Programming Supply Voltage

12

13

12

13

V

Programming Supply Current

50

50

mA

Input HIGH Programming Voltage

4.75

4.75

V

Input LOW Programming Voltage

0.4

0.4

V

Notes:

3.

See the last page of this specification for Group A subgroup testing information.

4.

See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.

5.

For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.]

Capacitance[4]

Parameter

Description

Test Conditions

Max.

Unit

Input Capacitance

10

pF

Output Capacitance

10

pF