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ADG412BRZ Datasheet(PDF) 3 Page - Analog Devices |
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ADG412BRZ Datasheet(HTML) 3 Page - Analog Devices |
3 / 16 page ADG411/ADG412/ADG413 Rev. D | Page 3 of 16 SPECIFICATIONS DUAL SUPPLY VDD = 15 V ± 10%, VSS = –15 V ± 10%, VL = 5 V ± 10%, GND = 0 V, unless otherwise noted.1 Table 1. B Version T Version Parameter +25°C −40°C to +85°C +25°C −55°C to +125°C Unit Test Conditions/Comments ANALOG SWITCH Analog Signal Range VDD to VSS VDD to VSS V RON 25 25 Ω typ VD = ±8.5 V, IS = −10 mA; 35 45 35 45 Ω max VDD = +13.5 V, VSS = −13.5 V LEAKAGE CURRENTS VDD = +16.5 V, VSS = −16.5 V Source OFF Leakage IS (OFF) ±0.1 ±0.1 nA typ VD = +15.5 V/−15.5 V, VS = −15.5 V/+15.5 V; ±0.25 ±0.25 ±0.25 ±20 nA max Figure 15 Drain OFF Leakage ID (OFF) ±0.1 ±0.1 nA typ VD = +15.5 V/−15.5 V, VS = −15.5 V/+15.5 V; ±0.25 ±5 ±0.25 ±20 nA max Figure 15 Channel ON Leakage ID, IS (ON) ±0.1 ±0.1 nA typ VD = VS = +15.5 V/−15.5 V; ±0.4 ±10 ±0.4 ± 40 nA max Figure 16 DIGITAL INPUTS Input High Voltage, VINH 2.4 2.4 V min Input Low Voltage, VINL 0.8 0.8 V max Input Current IINL or IINH 0.005 0.005 μA typ VIN = VINL or VINH ±0.5 ±0.5 μA max DYNAMIC CHARACTERISTICS2 tON 110 110 ns typ RL = 300 Ω, CL = 35 pF; 175 175 ns max VS = ±10 V; Figure 17 tOFF 100 100 ns typ RL = 300 Ω, CL = 35 pF; 145 145 ns max VS = ±10 V; Figure 17 Break-Before-Make Time Delay, tD (ADG413 Only) 25 25 ns typ RL = 300 Ω, CL = 35 pF; VS1 = VS2 = 10 V; Figure 18 Charge Injection 5 5 pC typ VS = 0 V, RS = 0 Ω, CL = 10 nF; Figure 19 OFF Isolation 68 68 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; Figure 20 Channel-to-Channel Crosstalk 85 85 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; Figure 21 CS (OFF) 9 9 pF typ f = 1 MHz CD (OFF) 9 9 pF typ f = 1 MHz CD, CS (ON) 35 35 pF typ f = 1 MHz POWER REQUIREMENTS VDD = +16.5 V, VSS = −16.5 V; Digital inputs = 0 V or 5 V IDD 0.0001 0.0001 μA typ 1 5 1 5 μA max ISS 0.0001 0.0001 μA typ 1 5 1 5 μA max IL 0.0001 0.0001 μA typ 1 5 1 5 μA max 1 Temperature ranges are as follows: B versions: −40°C to +85°C; T versions: −55°C to +125°C. 2 Guaranteed by design; not subject to production test. |
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