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CY7C1474V33-200BGC Datasheet(PDF) 10 Page - Cypress Semiconductor

Part # CY7C1474V33-200BGC
Description  72-Mbit (2 M x 36/4 M x 18/1 M x 72) Pipelined SRAM with NoBL??Architecture
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Manufacturer  CYPRESS [Cypress Semiconductor]
Direct Link  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

CY7C1474V33-200BGC Datasheet(HTML) 10 Page - Cypress Semiconductor

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CY7C1470V33
CY7C1472V33
CY7C1474V33
Document Number: 38-05289 Rev. *S
Page 10 of 38
and CE3 are all asserted active, and (3) the write signal WE is
asserted LOW. The address presented to the address inputs is
loaded into the address register. The write signals are latched
into the control logic block.
On the subsequent clock rise the data lines are automatically
tristated regardless of the state of the OE input signal. This
allows the external logic to present the data on DQ and DQP
(DQa,b,c,d,e,f,g,h/DQPa,b,c,d,e,f,g,h
for
CY7C1474V33,
DQa,b,c,d/DQPa,b,c,d for CY7C1470V33 and DQa,b/DQPa,b for
CY7C1472V33). In addition, the address for the subsequent
access (read/write/deselect) is latched into the address register
(provided the appropriate control signals are asserted).
On the next clock rise the data presented to DQ and DQP
(DQa,b,c,d,e,f,g,h/DQPa,b,c,d,e,f,g,h
for
CY7C1474V33,
DQa,b,c,d/DQPa,b,c,d for CY7C1470V33 and DQa,b/DQPa,b for
CY7C1472V33) (or a subset for byte write operations, see Write
Cycle Description table for details) inputs is latched into the
device and the write is complete.
The data written during the write operation is controlled by BW
(BWa,b,c,d,e,f,g,h for CY7C1474V33, BWa,b,c,d for CY7C1470V33
and BWa,b for CY7C1472V33) signals. The CY7C1470V33,
CY7C1472V33,
and
CY7C1474V33
provides
byte
write
capability that is described in the Write Cycle Description table.
Asserting the write enable input (WE) with the selected byte write
select (BW) input will selectively write to only the desired bytes.
Bytes not selected during a byte write operation will remain
unaltered. A synchronous self timed Write mechanism has been
provided to simplify the write operations. Byte write capability
has been included in order to greatly simplify read/modify/write
sequences, which can be reduced to simple byte write
operations.
Because
the
CY7C1470V33,
CY7C1472V33,
and
CY7C1474V33 are common I/O devices, data should not be
driven into the device while the outputs are active. The output
enable (OE) can be deasserted HIGH before presenting data to
the
DQ
and
DQP
(DQa,b,c,d,e,f,g,h/DQPa,b,c,d,e,f,g,h
for
CY7C1474V33, DQa,b,c,d/DQPa,b,c,d for CY7C1470V33 and
DQa,b/DQPa,b for CY7C1472V33) inputs. Doing so will tristate
the output drivers. As a safety precaution, DQ and DQP
(DQa,b,c,d,e,f,g,h/DQPa,b,c,d,e,f,g,h
for
CY7C1474V33,
DQa,b,c,d/DQPa,b,c,d for CY7C1470V33 and DQa,b/DQPa,b for
CY7C1472V33) are automatically tristated during the data
portion of a write cycle, regardless of the state of OE.
Burst Write Accesses
The CY7C1470V33, CY7C1472V33, and CY7C1474V33 has an
on-chip burst counter that allows the user the ability to supply a
single address and conduct up to four write operations without
reasserting the address inputs. ADV/LD must be driven LOW in
order to load the initial address, as described in the Single Write
Accesses section above. When ADV/LD is driven HIGH on the
subsequent clock rise, the chip enables (CE1, CE2, and CE3)
and WE inputs are ignored and the burst counter is incremented.
The correct BW (BWa,b,c,d,e,f,g,h for CY7C1474V33, BWa,b,c,d for
CY7C1470V33 and BWa,b for CY7C1472V33) inputs must be
driven in each cycle of the burst write in order to write the correct
bytes of data.
Sleep Mode
The ZZ input pin is an asynchronous input. Asserting ZZ places
the SRAM in a power conservation “sleep” mode. Two clock
cycles are required to enter into or exit from this “sleep” mode.
While in this mode, data integrity is guaranteed. Accesses
pending when entering the “sleep” mode are not considered valid
nor is the completion of the operation guaranteed. The device
must be deselected prior to entering the “sleep” mode. CE1, CE2,
and CE3, must remain inactive for the duration of tZZREC after the
ZZ input returns LOW.
Interleaved Burst Address Table
(MODE = Floating or VDD)
First
Address
A1:A0
Second
Address
A1:A0
Third
Address
A1:A0
Fourth
Address
A1:A0
00
01
10
11
01
00
11
10
10
11
00
01
11
10
01
00
Linear Burst Address Table
(MODE = GND)
First
Address
A1:A0
Second
Address
A1:A0
Third
Address
A1:A0
Fourth
Address
A1:A0
00
01
10
11
01
10
11
00
10
11
00
01
11
00
01
10
ZZ Mode Electrical Characteristics
Parameter
Description
Test Conditions
Min
Max
Unit
IDDZZ
Sleep mode standby current
ZZ
 V
DD 0.2 V
120
mA
tZZS
Device operation to ZZ
ZZ
 V
DD  0.2 V
2tCYC
ns
tZZREC
ZZ recovery time
ZZ
 0.2 V
2tCYC
–ns
tZZI
ZZ active to sleep current
This parameter is sampled
2tCYC
ns
tRZZI
ZZ Inactive to exit sleep current
This parameter is sampled
0
ns


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