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AF512SDI Datasheet(PDF) 10 Page - List of Unclassifed Manufacturers

Part # AF512SDI
Description  ATP Industrial Grade SD Card Specification
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Manufacturer  ETC1 [List of Unclassifed Manufacturers]
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Revision 3.7
ATP Industrial Grade SD Card Specification
2.3 Data Retention
512MB/2GB/4GB/8GB SD card
Endurance Used
Number of P/E Cycles Used
(block level)
Corresponding Data Retention at
25C use condition
10% P/E cycles
6,000 Cycles
10 years
100% P/E cycles
60,000 Cycles
1 year
1GB SD card
Endurance Used
Number of P/E Cycles Used
(block level)
Corresponding Data Retention at
25C use condition
10% P/E cycles
10,000 Cycles
10 years
100% P/E cycles
100,000 Cycles
1 year
Table 2-3: Data Retention
Note 1: Data retention refers to the ability of a memory bit to retain its data state over a period of time after the
data is written in NAND Flash regardless of whether the part is powered on or powered off.
A data retention failure is when there is at least 1 bit of data that cannot be read or is read incorrectly.
Note 2: NAND Flash suppliers refer to JEDEC JESD47 & JESD22 for Data Retention testing.
Based on the information provided by NAND Flash suppliers, ATP targets Data Retention as above table for
reference.
2.4 Performance
Model P/N
Seq. Read
(KB/s)
Seq. Write
(KB/s)
Random Read
(KB/s)
Random Write
(KB/s)
AF512SDI-5ACXX
19579
14998
17855
5078
AF1GSDI-5ACXX
18989
17009
17123
5371
AF2GSDI-5ADXX
20634
11296
18980
4154
AF4GSDI-5ACXX
20469
18720
18196
6081
AF8GSDI-5ACXX
20317
16377
18196
5577
Table 2-4: Performance
Note: Tested by HDBench 3.40 beta6 with 40MB file size. The performance may vary depending on the configuration,
firmware, setting, application and testing environment.
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ATP Confidential & Proprietary


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