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ISL71090SEHVF25 Datasheet(PDF) 1 Page - Intersil Corporation |
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ISL71090SEHVF25 Datasheet(HTML) 1 Page - Intersil Corporation |
1 / 10 page 1 Radiation Hardened Ultra Low Noise, Precision Voltage Reference ISL71090SEH25 The ISL71090SEH25 is an ultra low noise, high DC accuracy precision voltage reference with a wide input voltage range from 4V to 30V. The ISL71090SEH25 uses the Intersil Advanced Bipolar technology to achieve sub 2µVP-P 0.1Hz noise with an accuracy over temperature and radiation of 0.15%. The ISL71090SEH25 offers a 2.5V output voltage with 10ppm/°C temperature coefficient and also provides excellent line and load regulation. The device is offered in an 8 Ld Flatpack package. The ISL71090SEH25 is ideal for high-end instrumentation, data acquisition and applications requiring high DC precision where low noise performance is critical. Applications • RH voltage regulators precision outputs • Precision voltage sources for data acquisition system for space applications • Strain and pressure gauge for space applications Features • Reference output voltage . . . . . . . . . . . . . . . . . . .2.5V±0.05% • Accuracy over temperature and radiation . . . . . . . . . .±0.15% • Output voltage noise . . . . . . . . . . 2µVP-P Typ (0.1Hz to 10Hz) • Supply current . . . . . . . . . . . . . . . . . . . . . . . . . . . . 930µA (Typ) • Tempco (box method) . . . . . . . . . . . . . . . . . . . 10ppm/°C Max • Output current capability . . . . . . . . . . . . . . . . . . . . . . . . 20mA • Line regulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8ppm/V • Load regulation . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.5ppm/mA • Operating temperature range. . . . . . . . . . . .-55°C to +125°C • Radiation environment - High dose rate (50-300rad(Si)/s) . . . . . . . . . . . 100krad(Si) - Low dose rate (0.01rad(Si)/s) . . . . . . . . . . . . . 100krad(Si)* - SET/SEL/SEB . . . . . . . . . . . . . . . . . . . . . . . . 86MeV•cm2/mg *Product capability established by initial characterization. The “EH” version is acceptance tested on a wafer by wafer basis to 50krad(Si) at low dose rate • Electrically screened to SMD 5962-13211 Related Literature • AN1847, “ISL71090SEH25 Evaluation Board User’s Guide” • AN1848, “SEE Testing of the ISL71090SEH25” • AN1849, “Radiation Report of the ISL71090SEH25” FIGURE 1. ISL71090SEH25 TYPICAL APPLICATION DIAGRAM FIGURE 2. VOUT vs TEMPERATURE 0.1µF VEE VDD REFIN VDD BIPOFF VEE DACOUT GND VIN VREF 1µF D0 HS-565BRH 1 2 3 4 6 8 7 5 ISL71090SEH25 D12 1.1k C NOTE: Select C to minimize settling time. 2.497 2.498 2.499 2.500 2.501 2.502 2.503 -55 -5 45 95 145 TEMPERATURE (°C) 2.5V -0.1% 2.5V +0.1% UNIT2 UNIT3 UNIT4 UNIT5 UNIT1 June 6, 2013 FN8451.0 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas LLC 2013. All Rights Reserved Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries. All other trademarks mentioned are the property of their respective owners. |
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