BAT46WJ

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© NXP B.V. 2011. All rights reserved.

Product data sheet

Rev. 2 — 8 November 2011

7 of 12

NXP Semiconductors

BAT46WJ

Single Schottky barrier diode

8.

Test information

The current ratings for the typical waveforms as shown in Figure 7, 8 and 9 are

calculated according to the equations:

at DC, and

8.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.

Fig 10. Reverse recovery time test circuit and waveforms

trr

(1)

t

output signal

t

10 %

90 %

input signal

D.U.T.

SAMPLING

OSCILLOSCOPE

mga881

Fig 11. Duty cycle definition

P

t

006aaa812

duty cycle

δ =

I

FAV



I

M





=

I

RMS

I

FAV



=

I

RMS

I

M





=