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PKD01 Datasheet(PDF) 5 Page - Analog Devices |
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PKD01 Datasheet(HTML) 5 Page - Analog Devices |
5 / 18 page REV. A PKD01 –5– WAFER TEST LIMITS PKD01N Parameter Symbol Conditions Limit Unit “gm” AMPLIFIERS A, B Zero-Scale Error VZS 7mV max Input Offset Voltage VOS 6mV max Input Bias Current IB 250 nA max Input Offset Current IOS 75 nA max Voltage Gain AV RL = 10 k Ω, VO = ±10 V 10 V/mV min Common-Mode Rejection Ratio CMRR –10 V ≤ VCM ≤ +10 V 74 dB min Power Supply Rejection Ratio PSRR ±9 V ≤ V S ≤ ±18 V 76 dB min Input Voltage Range 1 VCM ±11.5 V min Feedthrough Error ∆VIN = 20 V, DET = 1, RST = 0 66 dB min COMPARATOR Input Offset Voltage VOS 3mV max Input Bias Current IB 1000 nA max Input Offset Current IOS 300 nA max Voltage Gain 1 AV 2 k Ω Pull-Up Resistor to 5 V 3.5 V/mV min Common-Mode Rejection Ratio CMRR –10 V ≤ V CM ≤ +10 V 82 dB min Power Supply Rejection Ratio PSRR ±9 V ≤ VS ≤ ±18 V 76 dB min Input Voltage Range 1 VCM ±11.5 V min Low Output Voltage VOL ISINK ≤ 5 mA, Logic GND = 5 V 0.4 V max –0.2 V min “OFF” Output Leakage Current IL VOUT = 5 V 80 µA max Output Short-Circuit Current ISC VOUT = 5 V 45 mA min 7 mA min DIGITAL INPUTS–RST, DET2 Logic “1” Input Voltage VH 2V min Logic “0” Input Voltage VL 0.8 V max Logic “1” Input Current IINH VH = 3.5 V 1 µA max Logic “0” Input Current IINL VL = 0.4 V 10 µA max MISCELLANEOUS Droop Rate 3 VDR TJ = 25 °C, 0.1 mV/ms max TA = 25 °C 0.20 mV/ms max Output Voltage Swing Amplifier C VOP RL = 2.5 k Ω±11 V min Short-Circuit Current Amplifier C ISC 40 mA max 7 mA min Power Supply Current ISY No Load 9 mA max gm AMPLIFIERS A, B Slew Rate SR 0.5 V/ µs Acquisition Time 1 tA 0.1% Accuracy, 20 V Step, AVCL = 1 41 µs tA 0.01% Accuracy, 20 V Step, AVCL = 1 45 µs COMPARATOR Response Time 5 mV Overdrive, 2 k Ω Pull-Up Resistor to 5 V 150 ns MISCELLANEOUS Switch Aperture Time tAP 75 ns Switching Time tS 50 ns Buffer Slew Rate SR RL = 2.5 k Ω 2.5 V/ µs NOTES 1Guaranteed by design. 2 DET = 1, RST = 0. 3Due to limited production test times, the droop current corresponds to junction temperature (T J). The droop current vs. time (after power-on) curve clarifies this point. Since most devices (in use) are on for more than 1 second, ADI specifies droop rate for ambient temperature (T A) also. The warmed-up (TA) droop current specification is correlated to the junction temperature (TJ) value. ADI has a droop current cancellation circuit that minimizes droop current at high temperature. Ambient (TA) temperature specifications are not subject to production testing. (@ VS = 15 V, CH = 1000 pF, TA = 25 C, unless otherwise noted.) |
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