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ADM483E Datasheet(PDF) 8 Page - Analog Devices |
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ADM483E Datasheet(HTML) 8 Page - Analog Devices |
8 / 12 page –8– REV. 0 ADM483E The ADM483E has been tested under worst case conditions using unshielded cables, and meets Classification 2 at severity Level 4. Data transmission during the transient condition is corrupted, but it may be resumed immediately following the EFT event without user intervention. RADIATED IMMUNITY (IEC1000-4-3) IEC1000-4-3 (previously IEC801-3) describes the measurement method and defines the levels of immunity to radiated electro- magnetic fields. It was originally intended to simulate the electro- magnetic fields generated by portable radio transceivers or any other device that generates continuous wave radiated electromag- netic energy. Its scope has since been broadened to include spurious EM energy, which can be radiated from fluorescent lights, thyristor drives, inductive loads, etc. Testing for immunity involves irradiating the device with an EM field. There are various methods of achieving this including use of anechoic chamber, stripline cell, TEM cell and GTEM cell. These consist essentially of two parallel plates with an electric field developed between them. The device under test is placed between the plates and exposed to the electric field. There are three severity levels having field strengths ranging from 1 V to 10 V/m. Results are classified in a similar fashion to those for IEC1000-4-2. 1. Normal Operation. 2. Temporary Degradation or loss of function that is self- recoverable when the interfering signal is removed. 3. Temporary degradation or loss of function that requires operator intervention or system reset when the interfering signal is removed. 4. Degradation or loss of function that is not recoverable due to damage. The ADM483E comfortably meets Classification 1 at the most stringent (Level 3) requirement. In fact, field strengths up to 30 V/m showed no performance degradation and error-free data transmission continued even during irradiation. Table VI. Level Field Strength V/m 11 23 310 EMI EMISSIONS The ADM483E contains internal slew rate limiting in order to minimize the level of electromagnetic interference generated. Figure 25 shows an FFT plot when transmitting a 150 kHz data stream. 10 0% 100 90 10dB/DIV 500kHz/DIV 0 5MHz Figure 25. Driver Output Waveform and FFT Plot Trans- mitting @ 150 kHz As may be seen, the slew limiting attenuates the high frequency components. EMI is therefore reduced, as are reflections due to improperly terminated cables. EN55022, CISPR22 defines the permitted limits of radiated and conducted interference from Information Technology Equipment (ITE). The objective is to control the level of emissions, both con- ducted and radiated. For ease of measurement and analysis, conducted emissions are assumed to predominate below 30 MHz, while radiated emissions predominate above this frequency. CONDUCTED EMISSIONS This is a measure of noise that is conducted onto the mains power supply. The noise is measured using a LISN (Linc Impedance Stabilizing Network) and a spectrum analyzer. The test setup is illustrated in Figure 26. The spectrum analyzer is set to scan the spectrum from 0 MHz to 30 MHz. Figure 27 shows that the level of conducted emissions from the ADM483E are well below the allowable limits. SPECTRUM ANALYSER DUT LISN PSU Figure 26. Conducted Emissions Test Setup |
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