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AD9224ARS Datasheet(PDF) 5 Page - Analog Devices |
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AD9224ARS Datasheet(HTML) 5 Page - Analog Devices |
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5 / 24 page  AD9224 –5– REV. A DEFINITIONS OF SPECIFICATION INTEGRAL NONLINEARITY (INL) INL refers to the deviation of each individual code from a line drawn from “negative full scale” through “positive full scale.” The point used as “negative full scale” occurs 1/2 LSB before the first code transition. “Positive full scale” is defined as a level 1 1/2 LSB beyond the last code transition. The deviation is measured from the middle of each particular code to the true straight line. DIFFERENTIAL NONLINEARITY (DNL, NO MISSING CODES) An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal value. Guaranteed no missing codes to 12-bit resolution indicates that all 4096 codes, respectively, must be present over all operating ranges. ZERO ERROR The major carry transition should occur for an analog value 1/2 LSB below VINA = VINB. Zero error is defined as the deviation of the actual transition from that point. GAIN ERROR The first code transition should occur at an analog value 1/2 LSB above negative full scale. The last transition should occur at an analog value 1 1/2 LSB below the nominal full scale. Gain error is the deviation of the actual difference between first and last code transitions and the ideal difference between first and last code transitions. TEMPERATURE DRIFT The temperature drift for zero error and gain error specifies the maximum change from the initial (+25 °C) value to the value at TMIN or TMAX. POWER SUPPLY REJECTION The specification shows the maximum change in full scale from the value with the supply at the minimum limit to the value with the supply at its maximum limit. APERTURE JITTER Aperture jitter is the variation in aperture delay for successive samples and is manifested as noise on the input to the A/D. APERTURE DELAY Aperture delay is a measure of the sample-and-hold amplifier (SHA) performance and is measured from the rising edge of the clock input to when the input signal is held for conversion. SIGNAL-TO-NOISE AND DISTORTION (S/N+D, SINAD) RATIO S/N+D is the ratio of the rms value of the measured input signal to the rms sum of all other spectral components below the Nyquist frequency, including harmonics but excluding dc. The value for S/N+D is expressed in decibels. EFFECTIVE NUMBER OF BITS (ENOB) For a sine wave, SINAD can be expressed in terms of the num- ber of bits. Using the following formula, N = (SINAD – 1.76)/6.02 it is possible to get a measure of performance expressed as N, the effective number of bits. Thus, effective number of bits for a device for sine wave inputs at a given input frequency can be calculated directly from its measured SINAD. TOTAL HARMONIC DISTORTION (THD) THD is the ratio of the rms sum of the first six harmonic com- ponents to the rms value of the measured input signal and is expressed as a percentage or in decibels. SIGNAL-TO-NOISE RATIO (SNR) SNR is the ratio of the rms value of the measured input signal to the rms sum of all other spectral components below the Nyquist frequency, excluding the first six harmonics and dc. The value for SNR is expressed in decibels. SPURIOUS FREE DYNAMIC RANGE (SFDR) SFDR is the difference in dB between the rms amplitude of the input signal and the peak spurious signal. |
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