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MRF6P23190H Datasheet(PDF) 7 Page - Freescale Semiconductor, Inc |
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MRF6P23190H Datasheet(HTML) 7 Page - Freescale Semiconductor, Inc |
7 / 11 page MRF6P23190HR6 7 RF Device Data Freescale Semiconductor TYPICAL CHARACTERISTICS W-CDMA TEST SIGNAL 250 108 90 TJ, JUNCTION TEMPERATURE (°C) Figure 12. MTTF versus Junction Temperature This above graph displays calculated MTTF in hours when the device is operated at VDD = 28 Vdc, Pout = 40 W Avg., and ηD = 23.5%. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product. 107 106 105 110 130 150 170 190 210 230 10 0.0001 100 0 PEAK−TO−AVERAGE (dB) Figure 13. CCDF W-CDMA 3GPP, Test Model 1, 64 DPCH, 67% Clipping, Single-Carrier Test Signal 10 1 0.1 0.01 0.001 24 68 W−CDMA. ACPR Measured in 3.84 MHz Channel Bandwidth @ ±5 MHz Offset. IM3 Measured in 3.84 MHz Bandwidth @ ±10 MHz Offset. PAR = 8.5 dB @ 0.01% Probability on CCDF Figure 14. 2-Carrier W-CDMA Spectrum f, FREQUENCY (MHz) 3.84 MHz Channel BW −IM3 in 3.84 MHz BW +IM3 in 3.84 MHz BW −ACPR in 3.84 MHz BW +ACPR in 3.84 MHz BW +20 +30 0 −10 −40 −50 −60 −70 −80 −20 20 515 10 0 −5 −10 −15 −20 −25 25 −30 |
Similar Part No. - MRF6P23190H_08 |
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Similar Description - MRF6P23190H_08 |
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