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AD5551 Datasheet(PDF) 5 Page - Analog Devices

Part No. AD5551
Description  5 V, Serial-Input Voltage-Output, 14-Bit DACs
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Maker  AD [Analog Devices]
Homepage  http://www.analog.com
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AD5551/AD5552
–5–
REV. 0
AD5552 PIN FUNCTION DESCRIPTIONS
Mnemonic
Pin No.
Description
RFB
1
Feedback Resistor. In bipolar mode connect this pin to external op amp output.
VOUT
2
Analog Output Voltage from the DAC.
AGNDF
3
Ground Reference Point for Analog Circuitry (Force).
AGNDS
4
Ground Reference Point for Analog Circuitry (Sense).
VREFS
5
This is the voltage reference input (sense) for the DAC. Connect to external reference ranges from
2 V to VDD.
VREFF
6
This is the voltage reference input (force) for the DAC. Connect to external reference ranges
from 2 V to VDD.
CS
7
This is an active low-logic input signal. The chip select signal is used to frame the serial data input.
SCLK
8
Clock input. Data is clocked into the input register on the rising edge of SCLK. Duty cycle
must be between 40% and 60%.
NC
9
No Connect.
DIN
10
Serial Data Input. This device accepts 14-bit words. Data is clocked into the input register on
the rising edge of SCLK.
LDAC
11
LDAC Input. When this input is taken low, the DAC register is simultaneously updated with
the contents of the input register.
DGND
12
Digital Ground. Ground reference for digital circuitry.
INV
13
Connected to the Internal Scaling Resistors of the DAC. Connect INV pin to external op amps
inverting input in bipolar mode.
VDD
14
Analog Supply Voltage, 5 V
± 10%.
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL)
is a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer function.
A typical INL versus code plot can be seen in TPC 1.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of
±1 LSB maximum
ensures monotonicity. TPC 4 illustrates a typical DNL versus
code plot.
Gain Error
Gain error is the difference between the actual and ideal analog
output range, expressed as a percent of the full-scale range.
It is the deviation in slope of the DAC transfer characteristic
from ideal.
Gain Error Temperature Coefficient
This is a measure of the change in gain error with changes in
temperature. It is expressed in ppm/
°C.
Zero Code Error
Zero code error is a measure of the output error when zero code
is loaded to the DAC register.
Zero Code Temperature Coefficient
This is a measure of the change in zero code error with a change
in temperature. It is expressed in mV/
°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s
and is measured when the digital input code is changed by 1 LSB
at the major carry transition. A plot of the glitch impulse is shown
in TPC 14.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into the
analog output of the DAC from the digital inputs of the DAC,
but is measured when the DAC output is not updated.
CS is
held high, while the CLK and DIN signals are toggled. It is
specified in nV-s and is measured with a full-scale code change
on the data bus, i.e., from all 0s to all 1s and vice versa. A typi-
cal plot of digital feedthrough is shown in TPC 13.
Power Supply Rejection Ratio
This specification indicates how the output of the DAC is affected
by changes in the power supply voltage. Power-supply rejection
ratio is quoted in terms of % change in output per % change in
VDD for full-scale output of the DAC. VDD is varied by
±10%.
Reference Feedthrough
This is a measure of the feedthrough from the VREF input to the
DAC output when the DAC is loaded with all 0s. A 100 kHz,
1 V p-p is applied to VREF. Reference feedthrough is expressed
in mV p-p.




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